Mechanical properties of Cu₆PS₅І superionic crystals and thin films
The hardness and Young’s modulus dependences on the instrumented indentation depth profiles in Cu₆PS₅І single crystals and Cu₆PS₅І-based thin films were investigated. The measurements of mechanical parameters were performed at room temperature by instrumented indentation in the continuous stiffness...
Gespeichert in:
| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2019 |
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2019
|
| Schlagworte: | |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/215428 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Mechanical properties of Cu₆PS₅І superionic crystals and thin films / V.V. Bilanych, А.V. Bendak, K.V. Skubenych, F. Lofaj, I.P. Studenyak, V.S. Bilanych, V.M. Rizak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 1. — С. 47-52. — Бібліогр.: 26 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1860479881473687552 |
|---|---|
| author | Bilanych, V.V. Bendak, А.V. Skubenych, K.V. Lofaj, F. Studenyak, I.P. Bilanych, V.S. Rizak, V.M. |
| author_facet | Bilanych, V.V. Bendak, А.V. Skubenych, K.V. Lofaj, F. Studenyak, I.P. Bilanych, V.S. Rizak, V.M. |
| citation_txt | Mechanical properties of Cu₆PS₅І superionic crystals and thin films / V.V. Bilanych, А.V. Bendak, K.V. Skubenych, F. Lofaj, I.P. Studenyak, V.S. Bilanych, V.M. Rizak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 1. — С. 47-52. — Бібліогр.: 26 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The hardness and Young’s modulus dependences on the instrumented indentation depth profiles in Cu₆PS₅І single crystals and Cu₆PS₅І-based thin films were investigated. The measurements of mechanical parameters were performed at room temperature by instrumented indentation in the continuous stiffness measurement mode with harmonic modulation of load during its linear increase. The variations of the hardness and Young’s modulus in Cu₆PS₅І single crystals were interpreted in the framework of the deformation gradient model. The decrease of micro-hardness in Cu₆PS₅І-based thin film observed with copper content increase was explained by the formation of conductive clusters and dendrites.
|
| first_indexed | 2026-03-23T18:51:19Z |
| format | Article |
| fulltext |
ISSN 1560-8034, 1605-6582 (On-line), SPQEO, 2019. V. 22, N 1. P. 47-52.
© 2019, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
47
Semiconductor physics
Mechanical properties of Cu6PS5І superionic crystals and thin films
V.V. Bilanych
1
, А.V. Bendak
1
, K.V. Skubenych
1
, F. Lofaj
2
, I.P. Studenyak
1
, V.S. Bilanych
1
, V.M. Rizak
1
1
Uzhhorod National University, 46, Pidhirna Str., 88000 Uzhhorod, Ukraine
2
Institute of Materials Research of SAS, 47 Watsonova Str., 04001 Kosice, Slovakia
*
Corresponding author phone: +380 997973016
E-mail: studenyak@dr.com
Abstract. The hardness and Young’s modulus dependences on the instrumented
indentation depth profiles in Cu6PS5I single crystals and Cu6PS5I-based thin films were
investigated. The measurements of mechanical parameters were performed at the room
temperature by instrumented indentation in the continuous stiffness measurement mode
with harmonic modulation of load during its linear increase. The variations of the hardness
and Young’s modulus in Cu6PS5І single crystals were interpreted in the framework of
deformation gradient model. The decrease of micro-hardness in Cu6PS5I-based thin film
observed with copper content increase was explained by formation of conductive clusters
and dendrites.
Keywords: superionic crystals, thin films, hardness, Young’s modulus, nano- and micro-
indentation.
doi: https://doi.org/10.15407/spqeo22.01.47
PACS 71.70.Gm, 61.43.Fs
Manuscript received 01.02.19; revised version received 18.02.19; accepted for publication
20.02.19; published online 30.03.19.
1. Introduction
Cu6PS5І compound belongs to the superionic conductors
with argyrodite structure [1]. It crystallizes in the cubic
crystal system (space group mF 34 ) at room
temperature. At low temperatures, the Cu6PS5І crystal
undergoes two phase transitions (PTs), one of them being
a first-order superionic and ferroelastic PT at
TI = 144…169 K, the other is second-order structural PT
at ТII = (269±2) K [2, 3]. Gagor et al. [3] noted that at
TI < T < TII the Cu6PS5І crystals belong to a cubic system
(space group cF 34 ), while at T < TI it belongs to the
monoclinic system (space group Cc). Electrical,
acoustical and optical properties of Cu6PS5І crystals as
well as the influence of structural and compositional
disordering onto physical properties of Cu6PS5І-type
superionic conductors were studied in numerous works
[4-9]. Due to the high electrical conductivity, they are
promising materials for wide application as the solid
electrolytes, supercapacitors, ion-selective membranes,
and others electrochemical devices. Moreover, they are
also interesting materials for the fundamental studies of
the order-disorder processes as well as of the structural
relaxation ones.
Information about physical parameters in submicron
regions is important for the development of nano-
composites and thin layers based on these superionic
materials. It is well known that if the volume of solid-
state sensing decreases (< 100 nm), the physical
parameters will approach to theoretically possible values
[10]. Instrumented indentation belongs to few effective
techniques that are able to detect mechanical properties
in this size range [11]. However, instrumented
indentation has not been used for the study of Cu6PS5І
single crystals and Cu6PS5І-based thin films up to now.
Therefore, the aim of this work was to investigate
the hardness and Young’s modulus dependences on the
penetration depth in Cu6PS5І single crystals and Cu6PS5І-
based thin films as a function of their chemical
composition by using nanoindentation.
2. Material and methods
The nanoindentation studies include measurements on
single crystals and thin films. Single crystals of Cu6PS5І
with the size of 5×5×3 mm were obtained using the
chemical transport evaporation method. Cu6PS5І-based
thin films were deposited onto silicate glass substrates
with non-reactive radiofrequency magnetron sputtering.
SPQEO, 2019. V. 22, N 1. P. 47-52.
Bilanych V.V., Bendak А.V., Skubenych K.V. et al. Mechanical properties of Cu6PS5І superionic crystals …
48
To obtain the thin films with different copper content, a
system with the glass substrate moving with respect to
pure copper and Cu6PS5І compound targets. Thus, the
ratio of chemical elements in the coating continuously
changed in dependence on the distance from the
corresponding targets. The chemical composition of the
thin films was determined using energy dispersive X-ray
spectroscopy (EDX).
The hardness H and indentation modulus E
measurements were performed using G200 (Agilent,
USA) nanoindenter at room temperature by using the
continuous stiffness measurement (CSM) mode in the
load control regime [11]. The load Fm on indenter
linearly increased up to 100 mN at a rate of 10 mN/s, and
simultaneously the harmonic force F1 with 1 mN
amplitude and frequency f = 45 Hz was applied to the
indenter. As a result, the time dependence of the resulting
load on the indenter can be described by the equation:
)sin(1 tFt
dt
dF
F ω⋅+⋅= , (1)
where smN10=
dt
dF
, fπ=ω 2 , F1 = 1 mN.
Microhardness measurements in Cu6PS5І-based thin
films with different copper content were performed using
PMT-3 microindenter (with the Vickers indenter) at
room temperature.
3. Results and discussion
3.1. Nanoindentation in single crystals
Fig. 1 shows the typical load – indentation depth “P–h”
curve in Cu6PS5І single crystal. The loading rate was
chosen in such a manner that the time of loading to the
maximum load was 10 s. The dwell time at the maximum
load was 10 s and 100 s. Qualitatively, the “P–h” curves
at both dwell times were identical, but the numerical
values of E and H for Cu6PS5І crystal were slightly
different (see Table). Small decrease in H at longer dwell
time indicates larger plastic deformation and
simultaneous increase of the indentation depth to more
pronounced hardening the crystal structure under the
indenter.
Fig. 2 shows the indentation modulus E and
hardness H depth profiles in Cu6PS5І single crystals.
Fig. 1. “P–h” diagram for Cu6PS5І crystal at the load
P = 100 mN during 10 s.
Each point for E and H in these plots was obtained by
averaging the measurements of these parameters at a
fixed depth of hi during 20 periods of harmonic load on
the indenter [11]. It can be seen that the most significant
changes of mechanical properties occurred at the depths
below 150 nm. At larger depths, monotonous decrease of
Eit and Hit at considerably lower rate was observed.
These changes in hardness are usually called
indentation size effects (ISE), and they are related to
generation and accumulation of geometrically necessary
dislocations and activation of slip systems [12]. It is also
known [10] that when the contact region decreases to
nanometer range, the values of hardness and elastic
modulus increase, and the σm/Е ratio approaches
theoretical limit of strength of an ideal crystal lattice
( 1.0≈
σ
E
m
), where σm is the maximum theoretical stress
the solid can withstand.
At the same time, changes in E(h) and H(h)
dependences for h < 150 nm may be the consequence of
a finite radius of the indenter tip, which strongly
influences contact area at small depths [21]. Fig. 2 shows
continuous decrease of Hit and Eit also at larger depths
h > 150 nm (just the slope is much lower than at smaller
depths). It can be assumed that the basic mechanisms of
plastic deformation resulting in formation of the indent
remained the same as at smaller depths just the
contributions of different mechanisms involved in
deformation changed with stress (and indentation depth)
Table. Mechanical parameters of Cu6PS5І single crystals and Cu6.4P1.2S4.6I0.8 thin film as a result of nanoindentation.
N
Material
H, GPa
10 s
E, GPa
10 s
H, GPa
100 s
E, GPa
100 s
H, GPa
h = 250 nm
E, GPa
h = 250 nm
Hmax,
GPa
hmax,
nm
1 Cu6PS5I
single crystal
3.3 69.9 3.2 73.9 4.4 79.6 7.1 95
2 Cu6.4P1.2S4.6I0.8
thin film
2.2 75.4 2.0 74.7 1.4 45.4 – –
SPQEO, 2019. V. 22, N 1. P. 47-52.
Bilanych V.V., Bendak А.V., Skubenych K.V. et al. Mechanical properties of Cu6PS5І superionic crystals …
49
Fig. 2. Dependences of the hardness H (1) and Young’s
modulus E (2) of Cu6PS5І crystal on the penetration depth of
indenter.
increase. The specified mechanisms can be related to
formation of various deformation zones in the contact
region, to migration of structural defects related changes
in the deformation mechanisms of the crystal. In
particular, under the sharp indenter in the investigated
materials the following areas of deformation such as
hydrostatic zone, gradient zone, elastoplastic zone, and
elastic zone are observed [13, 14]. The change in the
magnitude of these zones and their movement into the
depth of the film, to the substrate, leads to a change in the
stiffness in the region of the nanocontact and,
accordingly, to a change in the values of E and H.
When the possible effects of ISE and indenter tip
geometry are neglected, a dominance of the elastic
mechanism of crystals deformation can be assumed.
Then, the dependence P = f (h) can be approximated by
the equation [15],
3
3
4
rhEP R ⋅⋅= , (2)
where ER is the reduced modulus
( ) ( )
i
i
s
s
R EEE
22
111 ν−
+
ν−
= ,
r – radius at the indenter top, ν and E are Poisson’s ratio
and Young’s modulus of the investigated material (s) and
indentor (i), respectively. Eq. (2) from the Hertzian
theory of mechanical contact of ideal elastic bodies
corresponds to a purely elastic deformation [15].
Fig. 3 displays a part of “P-h” curve within the load
range 0…2.5 µN and the result of their approximation by
using Eq. (2). It is visible that the P(h) dependence is
well approximated by the Hertzian equation. After
neglecting possible indenter radius effects, we can
assume that the maximum depth value, for which Eq. (2)
is valid, determines the radius of hydrostatic pressure
zone.
Fig. 2 shows that the slopes of E and H
dependences at nm150≥h are reduced as compared to
those at smaller depths. This indicates that the main
Fig. 3. “P–h” diagram approximation by the Hertzian model for
Cu6PS5І in nanoregion.
deformation mechanism at nm150≥h gradually
stabilizes. It is generally accepted that plastic
deformation in the bulk crystalline materials involves the
movement of existing defects and formation of new ones,
especially dislocations in the contact region [10].
Generation and motion of point defects at the initial stage
of plastic deformation of Cu6PS5І crystals may also take
place.
The observed hardness dependence in Cu6PS5І
crystals with increasing the indentation depth can be
interpreted in the framework of the deformation gradient
model (MSG) [16-19]. The indentation of crystals would
be accompanied by generation of circular loops of
geometrically necessary dislocations [16] with Burgers
vectors normal to the plane surface of the crystal,
according to the strain gradient plasticity theory [18].
Formation of these dislocations leads to the deformation
strengthening the crystal. According to this model, the
H(h) dependence can be described by the equation [20]:
h
h
H
H
∗
+= 1
0
, (3)
where H is the hardness for a given depth of imprint h,
H0 – hardness in the limit of infinite depth (hardness in
the absence of strain gradient effects [17]) and h
*
–
characteristic length that depends on the indenter shape,
the shear modulus and H.
According to Eq. (3), H
2
should be linearly
dependent on h
–1
. Fig. 4 shows the dependences H(h) in
the coordinates “H
2
–h
–1
” for Cu6PS5І crystals. The
experimental dependence is well approximated by Eq. (3)
in the depth range nm600≥h . Thus, the dislocation
mechanism in Cu6PS5І crystals according to the gradient
model (MSG) [16-20] can be applied in this depth region.
Transformation of Eq. (3) allowed us to obtain the value
of H0 = 2.4 GPa from the “H
2
–h
–1
” dependence.
Subsequently, the value of h
*
= 0.89 µm was determined
from the slope of this line. In the transient 150 to 600 nm
SPQEO, 2019. V. 22, N 1. P. 47-52.
Bilanych V.V., Bendak А.V., Skubenych K.V. et al. Mechanical properties of Cu6PS5І superionic crystals …
50
Fig. 4. The size effects approximation of H(h) dependence for
the Cu6PS5І crystal in the model of gradient deformations in the
micro-region. The inset shows the H(h) dependence of the
Cu6PS5І crystal, normalized to H0, in the
“ 1
2
0
2
−−
h
H
H ”coordinates (1 – experiment, 2 – result of a linear
approximation).
region, a mixed mechanism of plastic deformation seems
to be valid. Formation of plastic deformation occurs at
the expense of both point defects and dislocations
movement.
3.2. Nanoindentation in thin films
Fig. 5 illustrates the hardness and indentation modulus
depth profiles in Cu6.4P1.2S4.6I0.8 thin film. These profiles
differ substantially from the analogous ones in Cu6PS5І
single crystals (Fig. 1) because of strong substrate effect.
There is a rapid increase of the H and E parameters
within the range h = 20…150 nm due to the effects of
indenter tip geometry. At nm150≥h , the slope
decreases, and small plateau is observed. It corresponds
Fig. 5. Dependences of the hardness H (1) and Young’s
modulus E (2) of Cu6.4P1.2S4.6I0.8 thin film on penetration depth
of indenter.
to the hardness of the coating. At larger depths, gradual
increase of the hardness and an approach to the hardness
of the substrate are observed.
It should be noted that the depth profiles in thin
films at nm100≤h are strongly influenced by indenter
tip radius and tip radius-to-coating thickness ratio [21]
and therefore, cannot be used for consideration of
physical mechanisms, as it was done in the bulk
materials.
The H(h) and E(h) depth profiles at h > 100 nm can
be explained using a model of soft thin film on a rigid
substrate [22]. During gradual increase of indenter
loading, the elastic (and later plastic) deformation zones
under the indenter gradually extend across the thickness
of the film and reach the substrate at certain load. Prior to
that, the properties of film are mostly measured; after
that, the measured H and E values are defined by a
gradually changing combination of mechanical properties
of the film and substrate. Obviously, the elastic substrate
has a greater influence on the contact stiffness related to
the elastic deformation than on hardness related to the
plastic deformation that occurs later [21-23]. Hardness of
the studied Cu6.4P1.2S4.6I0.8 film is given by the plateau in
the depth region 150…250 nm (Fig. 5). Plateau means
that const)( ≈hH and the general rule that the obtained
value should be from maximum 10% of the coating
thickness is fulfilled. At nm250≥h , contribution of
stiffer and harder substrate results in the increase of
measured values.
Fig. 6 illustrates microhardness dependence of
Cu6PS5І-based thin films on their composition. At
42 at.% Cu content, the hardness of the film was around
1.9 GPa. Cu content increase caused rapid decrease of the
films hardness to around 0.7 GPa. At the same time, the
conductivity of these films increased [24, 25]. It is well
known that high ionic conductivity of the investigated
thin films is caused by formation of conductive channels
from dendrites and crystal clusters by spinodal decom-
position when the copper content increases [26].
Fig. 6. Compositional dependences of the hardness H (1) and
electrical conductivity σ (2) for Cu6PS5І-based thin films.
SPQEO, 2019. V. 22, N 1. P. 47-52.
Bilanych V.V., Bendak А.V., Skubenych K.V. et al. Mechanical properties of Cu6PS5І superionic crystals …
51
In this case, the film would consist of rigid
nanocrystallites and their clusters distributed in more
ductile amorphous matrix [26]. Hardness may increase
due to this nanocomposite structure if the content of soft
matrix phase is sufficiently small. However, no such
effect was observed in Fig. 6. Apparently, plastic
deformation during indentation occurred by the
displacement of rigid clusters in the soft matrix and
therefore, the hardness of the film seems to be
determined by the stiffness of the matrix without the
influence of nanocrystals.
4. Conclusions
The hardness and indentation modulus of Cu6PS5І
crystals and thin films based on them were determined by
nanoindentation exhibited significant changes with the
increase of indentation depth. Deformation behavior in
Cu6PS5І crystals at small depths (<150 nm) can be
explained by a dislocation mechanism and the hardness
changes at larger indentation depths changes in accord
with the deformation gradient model. The corresponding
dependences of the hardness for Cu6PS5І-based thin films
were explained using the model of soft thin film on a
rigid substrate. The hardness of a thin films based on
Cu6PS5І decreased, and conductivity increased with the
increase of copper concentration. These effects can be
attributed to spinodal decomposition resulting in
formation of conducting clusters and dendrites in an
amorphous matrix.
References
1. Kuhs W.F., Nitsche R., Scheunemann K. The
argyrodites – a new family of the tetrahedrally
close-packed structures. Mat. Res. Bull. 1979. 14. P.
241–248.
2. Studenyak I.P., Kranjčec M., Kovacs Gy.Sh., Panko
V.V., Mitrovcij V.V., Mikajlo O.A. Structural
disordering studies in Cu6+δPS5I single crystals.
Mater. Sci. Eng. 2003. B 97. P. 34–38.
3. Gagor A., Pietraszko A., Kaynts D. Diffusion paths
formation for Cu
+
ions in superionic Cu6PS5I single
crystals studied in terms of structural phase
transition. J. Solid State Chem. 2005. 178. P. 3366–
3375.
4. Studenyak I.P., Stefanovich V.O., Kranjčec M.,
Desnica D.I., Azhnyuk Yu.M., Kovacs Gy.Sh.,
Panko V.V. Raman scattering studies of Cu6PS5Hal
(Hal = Cl, Br and I) fast-ion conductors. Solid State
Ionics. 1997. 95. P. 221–225.
5. Samulionis V., Banys J., Vysochanskii Y.,
Studenyak I. Investigation of ultrasonic and
acoustoelectric properties of ferroelectric-
semiconductor crystals. Ferroelectrics. 2006. 336.
P. 29–38.
6. Studenyak I.P., Kranjčec M., Kurik M. Urbach rule
and disordering processes in Cu6P(S1-xSex)5Br1-yIy
superionic conductors. J. Phys. Chem. Solids. 2006.
67. P. 807–817.
7. Studenyak I.P., Kranjčec M., Kovacs Gy.Sh.,
Desnica I.D., Panko V.V., Slivka V.Yu. Influence
of compositional disorder on optical absorption
processes in Cu6P(S1-xSex)5I crystals. J. Mater. Res.
2001. 16. P. 1600–1608.
8. Studenyak I.P., Kranjčec M., Kovacs Gy.S.,
Desnica-Franković I.D., Panko V.V., Guranich P.P.
Electric conductivity and optical absorption edge of
Cu6P(SexS1-x)5I fast-ion conductors in the selenium-
rich region. J. Phys. Chem. Solids. 2001. 62. P.
665–672.
9. Kranjčec M., Studenyak I.P., Bilanchuk V.V.,
Dyordyaj V.S., Panko V.V. Compositional
behaviour of Urbach absorption edge and exciton-
phonon interaction parameters in Cu6PS5I1-xBrx
superionic mixed crystals. J. Phys. Chem. Solids.
2004. 65. P. 1015–1020.
10. I. Golovin Yu.I. Nanoindentation and mechanical
properties of solids in submicrovolumes, thin near-
surface layers and films: A review. Physics of Solid
State. 2008. 50. P. 2205–2236.
11. Li X., Bhushan B. A review of nanoindentation
continuous stiffness measurement technique and its
applications. Materials Characterization. 2002. 48.
P. 11–36.
12. Milman Yu.V., Golubenko A.A., Dub S.N.
Indentation size effect in nanohardness. Acta
Materialia. 2002. 59. P. 7480–7487.
13. Giannakopoulos A.E., Suresh S. Determination of
elastoplastic properties by instrumented sharp
indentation. Scripta Mater. 1999. 40. P. 1191–1198.
14. Golovin Yu.I. Nanoindentation and Its Capabilities.
Moscow, Mashinostroenie, 2009 (in Russian).
15. Mason J.K., Lund A.C., Schuh C.A. Determining
the activation energy and volume for the onset of
plasticity during nanoindentation. Phys. Rev. B.
2006. 73. P. 054102:1–14.
16. Ashby M.F. The deformation of plastically non-
homogeneous materials. Phil. Mag. 1970. 21. P.
399–424.
17. Gao H., Huang Y., Nix W.D. Hutchinson J.W.
Mechanism based strain gradient plasticity – I.
Theory. J. Mech. Phys. Solids. 1999. 47. P. 1239–
1263.
18. Nix W.D., Gao H. Indentation size effects in
crystalline materials: A law for strain gradient
plasticity. J. Mech. Phys. Solids. 1998. 46. P. 411–
425.
19. Matthew R., Begley J., Hutchinson W. The
mechanics of size-dependent indentation. J. Mech.
Phys. Solids. 1998. 46. P. 2049–2068.
20. Zong Z., Lou J., Adewoye O.O., Elmustafa A.A.,
Hammad F., Soboyejo W.O. Indentation size effects
in the nano and microhardness of FCC single crystal
metals. Materials and Manufacturing Processes.
2007. 22. P. 228–237.
SPQEO, 2019. V. 22, N 1. P. 47-52.
Bilanych V.V., Bendak А.V., Skubenych K.V. et al. Mechanical properties of Cu6PS5І superionic crystals …
52
21. Lofaj F., Nemeth D. The effects of tip sharpness
and coating thickness on nanoindentation
measurements in hard coatings on softer substrates
by FEM. Thin Solid Films. 2017. 644. P. 173–181.
22. Tsui T.Y., Pharr G.M. Substrate effects on
nanoindentation mechanical property measurement
of soft films on hard substrates. J. Mater. Res. 1999.
14. P. 292–301.
23. Bilanych V.S., Lofaj F., Flachbart K., Csach K.,
Kuzma V.V., Rizak V.M. Nanoindentation of
amorphous films of the Ge-As-Se system. Physics
of Solid State. 2014. 56. P. 1163–1167.
24. Studenyak I., Rybak S., Bendak A., Izai V.,
Guranich P., Kúš P., Mikula M. Structural
disordering studies of Cu6PS5I-based thin films
deposited by magnetron sputtering. EPJ Web of
Conferences. 2017. 133. P. 02002:1–3.
25. Studenyak I.P., Bendak A.V., Izai V.Yu., Guranich
P.P., Kúš P., Mikula M., Grančič B., Zahoran M.,
Greguš J., Vincze A., Roch T., Plecenik T.
Electrical and optical parameters of Cu6PS5I-based
thin films deposited using magnetron sputtering.
Semiconductor Physics, Quantum Electronics &
Optoelectronics. 2016. 19. P. 79–83.
26. Studenyak I.P., Izai V.Yu., Bendak A.V., Guranich
P.P., Azhniuk Yu.M., Kúš P., Zahn D.R.T. Optical
and electrical properties of Cu6PS5I-based thin films
versus copper content variation. Ukr. J. Phys. Opt.
2017. 18. P. 232–238.
Authors and CV
Vasyl V. Bilanych, born in 1996.
This time, he studies at the magistracy
of Uzhhorod National University at
the Faculty of Physics. Authored 2
publications. The area of his scientific
interests includes relaxation pheno-
mena in chalcogenide materials.
Andrii V. Bendak, born in 1992.
Researcher at the Applied Physics
Department of Uzhhorod National
University, Ukraine. Authored 14
publications and 4 patents. The area
of his scientific interests includes
physical properties of superionic
conductors.
Kateryna V. Skubenych, born in
1985. She has completed post
graduate studies. Head of the
department of Patent and Licensing
Providing and Commercialization of
the Intellectual Property Objects at
Uzhhorod National University.
Authored 5 publications. The area of
her scientific interests includes relaxation phenomena in
chalcogenide materials.
František Lofaj, Assoc. Prof. RNDr.
DrSc., Head of department of
structural ceramics, Institute of
materials research, Kosice, Slovakia.
Scientific activities: PVD deposition
technologies for hard coatings,
nanoindentation and tribology of PVD
coatings, electron microscopy of ceramic materials,
atomic force microscopy, development of the methods for
testing mechanical properties of brittle materials.
Ihor P. Studenyak, born in 1960,
defended his Dr. Sc. degree in Physics
and Mathematics in 2003 and became
full professor in 2004. Vice-rector for
scientific work at Uzhhorod National
University, Ukraine. Authored over
200 publications, 120 patents, 15 text-
books. The area of his scientific interests includes
physical properties of semiconductors, ferroics and
superionic conductors.
Vitaliy S. Bilanych, born in 1963,
defended his PhD thesis in Physics
and Mathematics in 1993. Became
associate professor in 2003 and works
at the Applied Physics Department of
Uzhhorod National University.
Authored over 80 publications. The
area of his scientific interests includes physical properties
of non-crystalline semiconductors, relaxation phenomena
in chalcogenide materials.
Vasyl M. Rizak, Doctor of Physical
and Mathematical Sciences,
Professor, Head of Department of
solid-state electronics, information
security head of the Transcarpathian
branch of the Ukrainian Physical
Society. The area of scientific
interests is solid state physics.
|
| id | nasplib_isofts_kiev_ua-123456789-215428 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2026-03-23T18:51:19Z |
| publishDate | 2019 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Bilanych, V.V. Bendak, А.V. Skubenych, K.V. Lofaj, F. Studenyak, I.P. Bilanych, V.S. Rizak, V.M. 2026-03-16T11:00:21Z 2019 Mechanical properties of Cu₆PS₅І superionic crystals and thin films / V.V. Bilanych, А.V. Bendak, K.V. Skubenych, F. Lofaj, I.P. Studenyak, V.S. Bilanych, V.M. Rizak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 1. — С. 47-52. — Бібліогр.: 26 назв. — англ. 1560-8034 PACS: 71.70.Gm, 61.43.Fs https://nasplib.isofts.kiev.ua/handle/123456789/215428 https://doi.org/10.15407/spqeo22.01.47 The hardness and Young’s modulus dependences on the instrumented indentation depth profiles in Cu₆PS₅І single crystals and Cu₆PS₅І-based thin films were investigated. The measurements of mechanical parameters were performed at room temperature by instrumented indentation in the continuous stiffness measurement mode with harmonic modulation of load during its linear increase. The variations of the hardness and Young’s modulus in Cu₆PS₅І single crystals were interpreted in the framework of the deformation gradient model. The decrease of micro-hardness in Cu₆PS₅І-based thin film observed with copper content increase was explained by the formation of conductive clusters and dendrites. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Semiconductor physics Mechanical properties of Cu₆PS₅І superionic crystals and thin films Article published earlier |
| spellingShingle | Mechanical properties of Cu₆PS₅І superionic crystals and thin films Bilanych, V.V. Bendak, А.V. Skubenych, K.V. Lofaj, F. Studenyak, I.P. Bilanych, V.S. Rizak, V.M. Semiconductor physics |
| title | Mechanical properties of Cu₆PS₅І superionic crystals and thin films |
| title_full | Mechanical properties of Cu₆PS₅І superionic crystals and thin films |
| title_fullStr | Mechanical properties of Cu₆PS₅І superionic crystals and thin films |
| title_full_unstemmed | Mechanical properties of Cu₆PS₅І superionic crystals and thin films |
| title_short | Mechanical properties of Cu₆PS₅І superionic crystals and thin films |
| title_sort | mechanical properties of cu₆ps₅і superionic crystals and thin films |
| topic | Semiconductor physics |
| topic_facet | Semiconductor physics |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/215428 |
| work_keys_str_mv | AT bilanychvv mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms AT bendakav mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms AT skubenychkv mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms AT lofajf mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms AT studenyakip mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms AT bilanychvs mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms AT rizakvm mechanicalpropertiesofcu6ps5ísuperioniccrystalsandthinfilms |