Method for data processing in application to ohmic contacts

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2019
• Main Authors: Belyaev, A.E., Boltovets, N.S., Konakova, R.V., Kovtonjuk, V.M., Kudryk, Ya.Ya., Shynkarenko, V.V., Dub, M.M., Saj, P.O., Novitskii, S.V.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2019
• Subjects: Semiconductor physics
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/215433
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Method for data processing in application to ohmic contacts / A.E. Belyaev, N.S. Boltovets, R.V. Konakova, V.M. Kovtonjuk, Ya.Ya. Kudryk, V.V. Shynkarenko, M.M. Dub, P.O. Saj, S.V. Novitskii // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 1. — С. 11-18. — Бібліогр.: 11 назв. — англ.

The method of processing the data of electrophysical investigations of ohmic contacts has been developed. It allows obtaining more accurate results of measuring the contact resistance and additional information by analyzing the statistical and spatial distribution of input data. To test the method,...