Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe

It has been shown that the density of surface states at the interface of the Al-Al₂O₃–p-CdTe–Mo structure is sufficiently low. It was found that at the interface, being in the thermodynamically equilibrium state, there is a bend of the edge of the allowed bands, as evidenced by the values of the sur...

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Datum:2019
Hauptverfasser: Uteniyazov, A.K., Ismailov, K.A.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2019
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/215469
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Zitieren:Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe / A.K. Uteniyazov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 2. — С. 165-170. — Бібліогр.: 15 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Uteniyazov, A.K.
Ismailov, K.A.
author_facet Uteniyazov, A.K.
Ismailov, K.A.
citation_txt Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe / A.K. Uteniyazov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 2. — С. 165-170. — Бібліогр.: 15 назв. — англ.
collection DSpace DC
description It has been shown that the density of surface states at the interface of the Al-Al₂O₃–p-CdTe–Mo structure is sufficiently low. It was found that at the interface, being in the thermodynamically equilibrium state, there is a bend of the edge of the allowed bands, as evidenced by the values of the surface potential, which are equal to 0.17 eV before and 0.25 eV after treatment. It has been ascertained that the surface states in the lower half of the band gap are almost completely annealed. It has been shown that ultrasonic treatment significantly affects the fluctuations of surface charges at the interface and eliminates unstable point defects located in the surface layer of the semiconductor. It has been established that the ultrasonic treatment has practically no effect on the patterns of current transfer, both in the forward and reverse directions. It has been shown that after the ultrasonic treatment, the forward current increases by about 25…30%, and the reverse current decreases by 6…9%; the rectification coefficient increases by 1.4 times.
first_indexed 2026-03-23T18:52:47Z
format Article
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id nasplib_isofts_kiev_ua-123456789-215469
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2026-03-23T18:52:47Z
publishDate 2019
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Uteniyazov, A.K.
Ismailov, K.A.
2026-03-18T11:40:25Z
2019
Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe / A.K. Uteniyazov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 2. — С. 165-170. — Бібліогр.: 15 назв. — англ.
1560-8034
PACS: 72.10.-d, 73.61.Ga, 73.40.Sx
https://nasplib.isofts.kiev.ua/handle/123456789/215469
https://doi.org/10.15407/spqeo22.02.165
It has been shown that the density of surface states at the interface of the Al-Al₂O₃–p-CdTe–Mo structure is sufficiently low. It was found that at the interface, being in the thermodynamically equilibrium state, there is a bend of the edge of the allowed bands, as evidenced by the values of the surface potential, which are equal to 0.17 eV before and 0.25 eV after treatment. It has been ascertained that the surface states in the lower half of the band gap are almost completely annealed. It has been shown that ultrasonic treatment significantly affects the fluctuations of surface charges at the interface and eliminates unstable point defects located in the surface layer of the semiconductor. It has been established that the ultrasonic treatment has practically no effect on the patterns of current transfer, both in the forward and reverse directions. It has been shown that after the ultrasonic treatment, the forward current increases by about 25…30%, and the reverse current decreases by 6…9%; the rectification coefficient increases by 1.4 times.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Semiconductor physics
Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
Article
published earlier
spellingShingle Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
Uteniyazov, A.K.
Ismailov, K.A.
Semiconductor physics
title Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
title_full Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
title_fullStr Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
title_full_unstemmed Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
title_short Effect of ultrasound irradiation on the electro-physical properties of the structure of Al-Al₂O₃-CdTe
title_sort effect of ultrasound irradiation on the electro-physical properties of the structure of al-al₂o₃-cdte
topic Semiconductor physics
topic_facet Semiconductor physics
url https://nasplib.isofts.kiev.ua/handle/123456789/215469
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