Ellipsometric studies of (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals

• Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2019
• ISSN: 1560-8034
• Автори: Studenyak, I.P., Luchynets, M.M., Pop, M.M., Studenyak, V.I., Pogodin, A.I., Kokhan, O.P., Grančič, B., Kus, P.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2019
• Теми: Optics
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/215489
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Ellipsometric studies of (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals / I.P. Studenyak, M.M. Luchynets, M.M. Pop, V.I. Studenyak, A.I. Pogodin, O.P. Kokhan, B. Grančič, P. Kus // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 3. — С. 347-352. — Бібліогр.: 17 назв. — англ.

(Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals were grown using a direct crystallization technique from the melt. Refractive indices and extinction coefficients for mixed crystals were obtained from the spectral ellipsometry measurements. A nonlinear increase in the refractive indi...