Mueller polarimetry of discontinuous gold films
The problem of controlling the morphology of discontinuous gold films by the method of optical angular Mueller-polarimetry has been considered. A set of samples of such films with different amounts of sputtered metal has been fabricated and studied. The reference structure control was carried out by...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Date: | 2019 |
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2019
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/215491 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Mueller polarimetry of discontinuous gold films / O.V. Makarenko, A.L. Yampolskiy, V.V. Lendiel, L.V. Poperenko, V.O. Lysiuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 3. — С. 338-342. — Бібліогр.: 16 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862590552782929920 |
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| author | Makarenko, O.V. Yampolskiy, A.L. Lendiel, V.V. Poperenko, L.V. Lysiuk, V.O. |
| author_facet | Makarenko, O.V. Yampolskiy, A.L. Lendiel, V.V. Poperenko, L.V. Lysiuk, V.O. |
| citation_txt | Mueller polarimetry of discontinuous gold films / O.V. Makarenko, A.L. Yampolskiy, V.V. Lendiel, L.V. Poperenko, V.O. Lysiuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 3. — С. 338-342. — Бібліогр.: 16 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The problem of controlling the morphology of discontinuous gold films by the method of optical angular Mueller-polarimetry has been considered. A set of samples of such films with different amounts of sputtered metal has been fabricated and studied. The reference structure control was carried out by atomic force microscopy and measurement of the film resistivity. In this paper, only 4 elements of the upper left minor of the Mueller matrix have been discussed. It has been shown that a clear correlation between these elements and the amount of sputtered metal takes place. The two diagonal elements increase with the growth of the metal layer, while the other two demonstrate non-monotonic behavior. The dependences on the angle of light incidence for the diagonal elements are monotonic, and for the non-diagonal ones are opposite. The obtained results may be explained by the features of light scattering in the vicinity of the percolation threshold of an island gold film.
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| first_indexed | 2026-03-23T18:53:42Z |
| format | Article |
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| id | nasplib_isofts_kiev_ua-123456789-215491 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2026-03-23T18:53:42Z |
| publishDate | 2019 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Makarenko, O.V. Yampolskiy, A.L. Lendiel, V.V. Poperenko, L.V. Lysiuk, V.O. 2026-03-19T10:29:20Z 2019 Mueller polarimetry of discontinuous gold films / O.V. Makarenko, A.L. Yampolskiy, V.V. Lendiel, L.V. Poperenko, V.O. Lysiuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 3. — С. 338-342. — Бібліогр.: 16 назв. — англ. 1560-8034 PACS: 78.20.-e, 78.66.-w, 78.68.+m, 81.70.-q https://nasplib.isofts.kiev.ua/handle/123456789/215491 https://doi.org/10.15407/spqeo22.03.338 The problem of controlling the morphology of discontinuous gold films by the method of optical angular Mueller-polarimetry has been considered. A set of samples of such films with different amounts of sputtered metal has been fabricated and studied. The reference structure control was carried out by atomic force microscopy and measurement of the film resistivity. In this paper, only 4 elements of the upper left minor of the Mueller matrix have been discussed. It has been shown that a clear correlation between these elements and the amount of sputtered metal takes place. The two diagonal elements increase with the growth of the metal layer, while the other two demonstrate non-monotonic behavior. The dependences on the angle of light incidence for the diagonal elements are monotonic, and for the non-diagonal ones are opposite. The obtained results may be explained by the features of light scattering in the vicinity of the percolation threshold of an island gold film. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optics Mueller polarimetry of discontinuous gold films Article published earlier |
| spellingShingle | Mueller polarimetry of discontinuous gold films Makarenko, O.V. Yampolskiy, A.L. Lendiel, V.V. Poperenko, L.V. Lysiuk, V.O. Optics |
| title | Mueller polarimetry of discontinuous gold films |
| title_full | Mueller polarimetry of discontinuous gold films |
| title_fullStr | Mueller polarimetry of discontinuous gold films |
| title_full_unstemmed | Mueller polarimetry of discontinuous gold films |
| title_short | Mueller polarimetry of discontinuous gold films |
| title_sort | mueller polarimetry of discontinuous gold films |
| topic | Optics |
| topic_facet | Optics |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/215491 |
| work_keys_str_mv | AT makarenkoov muellerpolarimetryofdiscontinuousgoldfilms AT yampolskiyal muellerpolarimetryofdiscontinuousgoldfilms AT lendielvv muellerpolarimetryofdiscontinuousgoldfilms AT poperenkolv muellerpolarimetryofdiscontinuousgoldfilms AT lysiukvo muellerpolarimetryofdiscontinuousgoldfilms |