Island photonic structures: Properties and application in sensing and metrology
In this work, we consider a novel photonic crystal type, island resonator, as a perspective objects of the all-optical processing domain, which can be used in the logic gate and adder architecture. Another kind of novel structure, a gas-containing pneumatic photonic crystal, was considered as an opt...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2019 |
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2019
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| Schlagworte: | |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/215587 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Island photonic structures: Properties and application in sensing and metrology / E.Ya. Glushko, A.N. Stepanyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 4. — С. 430-436. — Бібліогр.: 25 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | In this work, we consider a novel photonic crystal type, island resonator, as a perspective objects of the all-optical processing domain, which can be used in the logic gate and adder architecture. Another kind of novel structure, a gas-containing pneumatic photonic crystal, was considered as an optical indicator of pressure uniting several pressure scales of magnitude. This type of device includes a layered elastic platform, optical fibers, and switching valves, all enclosed in a chamber. We have investigated the distribution of deformation and pressure inside a pneumatic photonic crystal, its bandgap structure, and light reflection changes depending on the influence of external pressure and temperature. A method has been proposed to determine the fundamental molar gas constant R with the relative standard uncertainty near 10⁻¹⁰ that is based on extra-accurate volume controlling and highly sensitive pressure measurements in the framework of the scale echeloning procedure.
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| ISSN: | 1560-8034 |