Island photonic structures: Properties and application in sensing and metrology

In this work, we consider a novel photonic crystal type, island resonator, as a perspective objects of the all-optical processing domain, which can be used in the logic gate and adder architecture. Another kind of novel structure, a gas-containing pneumatic photonic crystal, was considered as an opt...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2019
Main Authors: Glushko, E.Ya., Stepanyuk, A.N.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2019
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/215587
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Island photonic structures: Properties and application in sensing and metrology / E.Ya. Glushko, A.N. Stepanyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 4. — С. 430-436. — Бібліогр.: 25 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:In this work, we consider a novel photonic crystal type, island resonator, as a perspective objects of the all-optical processing domain, which can be used in the logic gate and adder architecture. Another kind of novel structure, a gas-containing pneumatic photonic crystal, was considered as an optical indicator of pressure uniting several pressure scales of magnitude. This type of device includes a layered elastic platform, optical fibers, and switching valves, all enclosed in a chamber. We have investigated the distribution of deformation and pressure inside a pneumatic photonic crystal, its bandgap structure, and light reflection changes depending on the influence of external pressure and temperature. A method has been proposed to determine the fundamental molar gas constant R with the relative standard uncertainty near 10⁻¹⁰ that is based on extra-accurate volume controlling and highly sensitive pressure measurements in the framework of the scale echeloning procedure.
ISSN:1560-8034