Borcha, M., Solodkyi, M., Balovsyak, S., Tkach, V., Hutsuliak, I., Kuzmin, A., . . . Swiatek, Z. (2019). Features of structural changes in mosaic Ge: Sb according to X-ray diffractometry and electron backscatter diffraction data. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Borcha, M.D, et al. "Features of Structural Changes in Mosaic Ge: Sb According to X-ray Diffractometry and Electron Backscatter Diffraction Data." Semiconductor Physics Quantum Electronics & Optoelectronics 2019.
Стиль цитування MLA (8-ме видання)Borcha, M.D, et al. "Features of Structural Changes in Mosaic Ge: Sb According to X-ray Diffractometry and Electron Backscatter Diffraction Data." Semiconductor Physics Quantum Electronics & Optoelectronics, 2019.