Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data
The structural homogeneity and degree of perfection inherent to mosaic Ge:Sb samples were investigated. The modified methods for analyzing diffraction images of backscattered electrons (Kikuchi patterns) were used to reduce the influence of instrumental factors. The root-mean-square deformations in...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2019 |
| Автори: | , , , , , , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2019
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/215595 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data / M.D. Borcha, M.S. Solodkyi, S.V. Balovsyak, V.M. Tkach, I.I. Hutsuliak, A.R. Kuzmin, O.O. Tkach, V.P. Kladko, O.Yo. Gudymenko, О.І. Liubchenko, Z. Swiatek // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 4. — С. 381-386. — Бібліогр.: 26 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862531642358235136 |
|---|---|
| author | Borcha, M.D. Solodkyi, M.S. Balovsyak, S.V. Tkach, V.M. Hutsuliak, I.I. Kuzmin, A.R. Tkach, O.O. Kladko, V.P. Gudymenko, O.Yo. Liubchenko, О.І. Swiatek, Z. |
| author_facet | Borcha, M.D. Solodkyi, M.S. Balovsyak, S.V. Tkach, V.M. Hutsuliak, I.I. Kuzmin, A.R. Tkach, O.O. Kladko, V.P. Gudymenko, O.Yo. Liubchenko, О.І. Swiatek, Z. |
| citation_txt | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data / M.D. Borcha, M.S. Solodkyi, S.V. Balovsyak, V.M. Tkach, I.I. Hutsuliak, A.R. Kuzmin, O.O. Tkach, V.P. Kladko, O.Yo. Gudymenko, О.І. Liubchenko, Z. Swiatek // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 4. — С. 381-386. — Бібліогр.: 26 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The structural homogeneity and degree of perfection inherent to mosaic Ge:Sb samples were investigated. The modified methods for analyzing diffraction images of backscattered electrons (Kikuchi patterns) were used to reduce the influence of instrumental factors. The root-mean-square deformations in the local regions of separate grains and at the boundaries between them were determined using the value of the spatial frequency of the energy spectrum of the two-dimensional Fourier transform of Kikuchi patterns. It is shown that the maximum values of deformations (∼3.5⋅10⁻³) are typical for local regions, which are usually located at the boundaries between subgrains. X-ray studies confirm the obtained values of root-mean-square deformations.
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| first_indexed | 2026-03-23T18:59:17Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-215595 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2026-03-23T19:08:21Z |
| publishDate | 2019 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Borcha, M.D. Solodkyi, M.S. Balovsyak, S.V. Tkach, V.M. Hutsuliak, I.I. Kuzmin, A.R. Tkach, O.O. Kladko, V.P. Gudymenko, O.Yo. Liubchenko, О.І. Swiatek, Z. 2026-03-20T08:45:50Z 2019 Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data / M.D. Borcha, M.S. Solodkyi, S.V. Balovsyak, V.M. Tkach, I.I. Hutsuliak, A.R. Kuzmin, O.O. Tkach, V.P. Kladko, O.Yo. Gudymenko, О.І. Liubchenko, Z. Swiatek // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 4. — С. 381-386. — Бібліогр.: 26 назв. — англ. 1560-8034 PACS: 61.05.cp, 61.05.J-, 61.72.Dd, 61.05.jm, 61.72.Mm, 61.72.uf, 68.35.Gy https://nasplib.isofts.kiev.ua/handle/123456789/215595 https://doi.org/10.15407/spqeo22.04.381 The structural homogeneity and degree of perfection inherent to mosaic Ge:Sb samples were investigated. The modified methods for analyzing diffraction images of backscattered electrons (Kikuchi patterns) were used to reduce the influence of instrumental factors. The root-mean-square deformations in the local regions of separate grains and at the boundaries between them were determined using the value of the spatial frequency of the energy spectrum of the two-dimensional Fourier transform of Kikuchi patterns. It is shown that the maximum values of deformations (∼3.5⋅10⁻³) are typical for local regions, which are usually located at the boundaries between subgrains. X-ray studies confirm the obtained values of root-mean-square deformations. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Semiconductor Physics Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data Article published earlier |
| spellingShingle | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data Borcha, M.D. Solodkyi, M.S. Balovsyak, S.V. Tkach, V.M. Hutsuliak, I.I. Kuzmin, A.R. Tkach, O.O. Kladko, V.P. Gudymenko, O.Yo. Liubchenko, О.І. Swiatek, Z. Semiconductor Physics |
| title | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data |
| title_full | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data |
| title_fullStr | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data |
| title_full_unstemmed | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data |
| title_short | Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data |
| title_sort | features of structural changes in mosaic ge:sb according to x-ray diffractometry and electron backscatter diffraction data |
| topic | Semiconductor Physics |
| topic_facet | Semiconductor Physics |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/215595 |
| work_keys_str_mv | AT borchamd featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT solodkyims featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT balovsyaksv featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT tkachvm featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT hutsuliakii featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT kuzminar featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT tkachoo featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT kladkovp featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT gudymenkooyo featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT liubchenkooí featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata AT swiatekz featuresofstructuralchangesinmosaicgesbaccordingtoxraydiffractometryandelectronbackscatterdiffractiondata |