Deibuk, V., Yuriychuk, I., & Lemberski, I. (2020). Fidelity of noisy multiple-control reversible gates. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago Style (17th ed.) CitationDeibuk, V.G, I.M Yuriychuk, and I. Lemberski. "Fidelity of Noisy Multiple-control Reversible Gates." Semiconductor Physics Quantum Electronics & Optoelectronics 2020.
MLA (8th ed.) CitationDeibuk, V.G, et al. "Fidelity of Noisy Multiple-control Reversible Gates." Semiconductor Physics Quantum Electronics & Optoelectronics, 2020.
Warning: These citations may not always be 100% accurate.