Fidelity of noisy multiple-control reversible gates

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2020
• Hauptverfasser: Deibuk, V.G., Yuriychuk, I.M., Lemberski, I.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2020
• Schlagworte: Physics of microelectronic devices
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/215912
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Fidelity of noisy multiple-control reversible gates / V.G. Deibuk, I.M. Yuriychuk, I. Lemberski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2020. — Т. 23, № 4. — С. 385-392. — Бібліогр.: 15 назв. — англ.

The effect of frequency noise on the correct operation of the multiple-control Toffoli, Fredkin, and Peres gates has been discussed. In the framework of the Ising model, the energy spectrum of a chain of atoms with nuclear spins one-half in a spinless semiconductor matrix has been obtained, and allo...