The boson peak and the first sharp diffraction peak in (As₂S₃)ₓ(GeS₂)₁₋ₓ glasses
The parameters of the boson peak (BP) and the first sharp diffraction peak (FSDP) in (As₂S₃)ₓ(GeS₂)₁₋ₓ glasses measured using high-resolution Raman spectroscopy and high-energy synchrotron X-ray diffraction measurements are examined as a function of x. It has been found that there is no correlation...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2021 |
| ISSN: | 1560-8034 |
| Main Authors: | Stronski, A.V., Kavetskyy, T.S., Revutska, L.O., Kaban, I., Jovari, P., Shportko, K.V., Sergienko, V.P., Popovych, M.V. |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2021
|
| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/216224 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | The boson peak and the first sharp diffraction peak in (As₂S₃)ₓ(GeS₂)₁₋ₓ glasses / A.V. Stronski, T.S. Kavetskyy, L.O. Revutska, I. Kaban, P. Jovari, K.V. Shportko, V.P. Sergienko, M.V. Popovych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2021. — Т. 24, № 3. — С. 312-318. — Бібліогр.: 28 назв. — англ. |
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