The boson peak and the first sharp diffraction peak in (As₂S₃)ₓ(GeS₂)₁₋ₓ glasses

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2021
• Hauptverfasser: Stronski, A.V., Kavetskyy, T.S., Revutska, L.O., Kaban, I., Jovari, P., Shportko, K.V., Sergienko, V.P., Popovych, M.V.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2021
• Schlagworte: Optics
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/216224
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: The boson peak and the first sharp diffraction peak in (As₂S₃)ₓ(GeS₂)₁₋ₓ glasses / A.V. Stronski, T.S. Kavetskyy, L.O. Revutska, I. Kaban, P. Jovari, K.V. Shportko, V.P. Sergienko, M.V. Popovych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2021. — Т. 24, № 3. — С. 312-318. — Бібліогр.: 28 назв. — англ.

The parameters of the boson peak (BP) and the first sharp diffraction peak (FSDP) in (As₂S₃)ₓ(GeS₂)₁₋ₓ glasses measured using high-resolution Raman spectroscopy and high-energy synchrotron X-ray diffraction measurements are examined as a function of x. It has been found that there is no correlation...