Development of technique for testing the long-term stability of silicon microstrip detectors
An automatic multi-channel set-up prototype for simultaneous testing of the Long-Term Stability (LTS)
 *
 of more
 than ten detectors is described. The Inner Tracking System of the ALICE experiment will include about two thousand
 Double-Sided Microstrip Detectors (DS...
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| Published in: | Вопросы атомной науки и техники |
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| Date: | 2006 |
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| Format: | Article |
| Language: | English |
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2006
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| Cite this: | Development of technique for testing the long-term stability of silicon microstrip detectors / A.V. Kosinov, N. I. Maslov, S. V. Naumov, V. D. Ovchinnik, A. F. Starodubtsev,
 G. P. Vasilyev, V. I. Yalovenko,L. Bosisio // Вопросы атомной науки и техники. — 2006. — № 2. — С.163-165. — Бібліогр.:6 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1860046109210050560 |
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| author | Kosinov, A.V. Maslov, N. I. Naumov, S. V. Ovchinni, V. D. Starodubtsev, A. F. Vasilyev, G. P. Yalovenko, V. I. Bosisio, L. |
| author_facet | Kosinov, A.V. Maslov, N. I. Naumov, S. V. Ovchinni, V. D. Starodubtsev, A. F. Vasilyev, G. P. Yalovenko, V. I. Bosisio, L. |
| citation_txt | Development of technique for testing the long-term stability of silicon microstrip detectors / A.V. Kosinov, N. I. Maslov, S. V. Naumov, V. D. Ovchinnik, A. F. Starodubtsev,
 G. P. Vasilyev, V. I. Yalovenko,L. Bosisio // Вопросы атомной науки и техники. — 2006. — № 2. — С.163-165. — Бібліогр.:6 назв. — англ. |
| collection | DSpace DC |
| container_title | Вопросы атомной науки и техники |
| description | An automatic multi-channel set-up prototype for simultaneous testing of the Long-Term Stability (LTS)
*
of more
than ten detectors is described. The Inner Tracking System of the ALICE experiment will include about two thousand
Double-Sided Microstrip Detectors (DSMD). Efficient automatic measurement techniques are crucial for the
LTS test, because the corresponding test procedure should be performed on each detector and requires long times, at
least two days. By using special adapters for supporting and connecting the bare DSMDs, failing detectors can be
screened out before module assembly, thus minimizing the cost. Automated probe stations developed for a special
purpose or for microelectronics industry are used for measuring physical static DSMD characteristics and check
good-to-bad element ratio for DSMD. However, automated (or semi-automatic) test benches for studying LTS or
testing DSMD long-term stability before developing a detecting module are absent.
Важная часть тестирования детектора и процедура определения гарантии качества состоит в изучении долговременной стабильности основных характеристик (ДСХ) детекторов, включая исследование эффектов влияния окружающей среды, таких как влажность или температура. В данной работе описаны метод тестирования и автоматический многоканальный стенд, специально разработанный для одновременного тестирования ДСХ более чем десяти детекторов
Важлива частина тестування детектора і процедури визначення гарантії якості складається у вивченні
довгострокової стабільності основних характеристик (ДСХ) детекторів, включаючи дослідження ефектів
впливу навколишнього середовища, таких як вологість або температура. У даній роботі описані метод
тестування та автоматичний стенд, спеціально розроблений для одночасного тестування ДСХ більш ніж
десяти детекторів.
|
| first_indexed | 2025-12-07T16:58:01Z |
| format | Article |
| fulltext |
DEVELOPMENT OF TECHNIQUE FOR TESTING THE LONG-TERM
STABILITY OF SILICON MICROSTRIP DETECTORS
A.V. Kosinov, N. I. Maslov, S. V. Naumov, V. D. Ovchinnik, A. F. Starodubtsev,
G. P. Vasilyev, V. I. Yalovenko, L. Bosisio1
NSC KIPT, Kharkov, Ukraine
1Istituto Nazionale di Fisica Nucleare, Sezione di Trieste, Trieste, Italy
E-mail: nikolai.maslov@kipt.kharkov.ua
An automatic multi-channel set-up prototype for simultaneous testing of the Long-Term Stability (LTS)* of more
than ten detectors is described. The Inner Tracking System of the ALICE experiment will include about two thou-
sand Double-Sided Microstrip Detectors (DSMD). Efficient automatic measurement techniques are crucial for the
LTS test, because the corresponding test procedure should be performed on each detector and requires long times, at
least two days. By using special adapters for supporting and connecting the bare DSMDs, failing detectors can be
screened out before module assembly, thus minimizing the cost. Automated probe stations developed for a special
purpose or for microelectronics industry are used for measuring physical static DSMD characteristics and check
good-to-bad element ratio for DSMD. However, automated (or semi-automatic) test benches for studying LTS or
testing DSMD long-term stability before developing a detecting module are absent.
PACS: 29.40.Wk
1. INTRODUCTION
Long-term stability of detector characteristics is a
subject of study by several collaborations who are using
microstrip detectors in their experimental apparatuses
[1-3]. The Inner Tracking System of the ALICE experi-
ment will include about two thousand Double-Sided Mi-
crostrip Detectors (DSMD) which are required to work
reliably for a long time (order of ten years), with very
limited access for repairs or replacements in case of
component failure [4]. During their operation many fac-
tors, like: micro break-downs of the p/n junctions mak-
ing up each of the thousands of detecting elements,
charge build-up at the Si-SiO2 interface, degradation of
guard rings, drift of ionic charges at the detector sur-
face, etc. could change the parameters of the DSMD [1].
As a consequence, an important part of the detector test
and quality assurance procedure must consist of the ver-
ification and systematic study of the long-term stability
of the basic characteristics of the sensors (leakage cur-
rents, inter-electrode impedance), including an investi-
gation of the effect of such environmental conditions as
humidity levels or temperatures differing from those
foreseen during normal operation inside the ALICE ap-
paratus.
Automated probe stations developed for a special
purpose [5] or for microelectronics industry [6] are used
for measuring physical static DSMD characteristics and
check good-to-bad element ratio for DSMD. However,
automated (or semi-automatic) test benches for studying
LTS or testing DSMD long-term stability before devel-
oping a detecting module are absent.
2. AUTOMATIC MULTI-CHANNEL SET-UP
The set-up prototype consists of the following ele-
ments: bias-voltage supply unit, switching unit (switch
card), current-measuring device, input-output device,
temperature sensor, humidity sensor, light-tight box,
and computer with special software installed (Fig.1).
Fig.1. Automatic bench for studying long-term sta-
bility of microstrip detectors, where: det.1-det.N are the
detectors being monitored, TS is the temperature sen-
sor, MI is the measuring instrument, PS is the (bias)
voltage supply unit, I/O is the input-output register
The detectors under test are placed inside the light-
tight box together with the temperature and humidity sen-
sors. The supply unit, the temperature and humidity
probes and the switch card are connected to the computer
via the input-output register. As a temperature probe a
specialized microchip is employed, connected via the in-
put-output register. The bench is supplied with a system
which monitors the operation of the computer and sends
an alarm in case of malfunctioning (Fig.1, tracker
system). This helps preventing losses of test results.
3. SOFTWARE OF THE AUTOMATIC SET-UP
The computer software can control the voltage out-
put from the supply unit, which is fed in parallel to the
elements of the microstrip and/or single-element detec-
tors. The computer ramps up or down the bias voltage in
steps before and after the LTS test. It is possible to mea-
sure the total leakage currents of the microstrip detec-
tors, the leakage currents of guard rings, the leakage
currents of a few strips, and the leakage currents of the
single-element detectors in the range from 10 pA to
1 mA. At regular time intervals during the test, the com-
puter writes in a file the values of the parameters mea-
sured for each detector, together with the time stamp
and the temperature/humidity values. Fig.2 shows the
control system screen before measurements.
__________________________________________________________
PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. 2006. № 2.
Series: Nuclear Physics Investigations (46), p.163-165.
163
Fig.2. The control system screen before measurements
During measurement, parameters can be presented in
numerical or graphical mode.
Fig.3. The control system screen during measurements
in numerical mode
Fig.4. The control system screen during measurements
in graphical mode
4. PROCEDURE OF LONG-TERM STABIL-
ITY TEST
The foreseen procedure for the LTS test consists in the
periodic repetition of the leakage current measurement
of the different electrodes of the detectors during a long
time period. The detectors are placed in a dark box,
mounted on custom made adapters that will include spe-
cial micropositioners for the electrical contacts to detec-
tors. The switch card will perform and manage the con-
nections between the various detectors under test, the
power supply and the measuring instruments. The com-
puter controls the power supply and the switch card, and
reads out the data from the I/V-meter and the tempera-
ture/humidity sensors using specially developed soft-
ware. The switch card allows us to measure the leakage
currents of the bias line, the guard ring and a sample
strip for each of the detectors under test, using a single
I-meter. The voltage is continuously applied to the de-
tectors for the whole duration of the test (typically 48
hours or more).
Fig.5. Leakage current of the detector active area and
temperature variation versus time. Planar detector with
the active area of SAA=5×5 mm
Fig.6. Leakage current of the detector guard ring and
temperature variation versus time. Planar detector with
the active area of SAA=5×5 mm
Fig.7. Leakage current of the detector active area
(above) and temperature variation (below) versus time.
Regime of temperature stabilization
__________________________________________________________
PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. 2006. № 2.
Series: Nuclear Physics Investigations (46), p.163-165.
163
Fig.8. Leakage current of the detector guard ring and
temperature variation versus time. Regime of temperat-
ure stabilization
In order to allow an investigation of the physical pro-
cesses leading to instabilities in the detector parameters,
the system provides the possibility to measure the cur-
rent-voltage characteristics of detectors both before and
after the LTS test.
REFERENCES
1. A.Bischoff, N.Findeis, D.Hauff et al. Breakdown
protection and long-term stabilization for Si-detec-
tors // Nucl. Instr. and Methods. 1993, A326, p.27-
37.
2. ATLAS SCT Detector QA Procedures. ATLAS
SCT/Detector FDR/99-7.
3. ALICE microstrip detector specification.
4. A.V. Kosinov, N. I. Maslov, S. V. Naumov et al.
Development of Technique for Testing the Long-
Term Stability of Silicon Microstrip Detectors. Ab-
stracts of Nuclear Science Symposium. 2004,
Rome, Italy, p.55.
5. A.A.Kaplij, V.I.Kulibaba, N.I.Maslov et al. Control
complex for a double-sided microstrip detector pro-
duction and tests // Problems of Atomic Science and
Technology. Series: Nuclear Physics Investigations.
2000, №3(36), p.41-45.
6. I. Rashevskaia, L. Bosisio, S. Potin, O. Starodubt-
sev. Test and quality control of double-sided silicon
microstrip sensors for the ALICE experiment // Nu-
cl. Instr. and Methods. 2004, v.A530, p.59-64.
УСОВЕРШЕНСТВОВАНИЕ МЕТОДИКИ ТЕСТИРОВАНИЯ ДОЛГОВРЕМЕННОЙ СТАБИЛЬНО-
СТИ КРЕМНИЕВЫХ МИКРОСТРИПОВЫХ ДЕТЕКТОРОВ
А.В. Косинов, Н.И. Маслов, С.В. Наумов, В.Д. Овчинник, А.Ф. Стародубцев, Г.П Васильев,
В.И. Яловенко, Л.Босисио
Важная часть тестирования детектора и процедура определения гарантии качества состоит в изучении
долговременной стабильности основных характеристик (ДСХ) детекторов, включая исследование эффектов
влияния окружающей среды, таких как влажность или температура. В данной работе описаны метод тести-
рования и автоматический многоканальный стенд, специально разработанный для одновременного тестиро-
вания ДСХ более чем десяти детекторов.
Эта работа поддержана частично INTAS, проект № 03-55-964.
УДОСКОНАЛЕННЯ МЕТОДИКИ ТЕСТУВАННЯ ДОВГОСТРОКОВОЇ СТАБІЛЬНОСТІ
КРЕМНІЄВИХ МІКРОСТРИПОВЫХ ДЕТЕКТОРІВ
А.В. Косінов, М.І. Маслов, С.В. Наумов, В.Д. Овчінник, А.Ф. Стародубцев, Г.П Васільєв,
В.І. Яловенко, Л.Босісіо
Важлива частина тестування детектора і процедури визначення гарантії якості складається у вивченні
довгострокової стабільності основних характеристик (ДСХ) детекторів, включаючи дослідження ефектів
впливу навколишнього середовища, таких як вологість або температура. У даній роботі описані метод
тестування та автоматичний стенд, спеціально розроблений для одночасного тестування ДСХ більш ніж
десяти детекторів.
Ця робота підтримана частково INTAS, проект № 03-55-964.
156
PACS: 29.40.Wk
3. SOFTWARE OF THE AUTOMATIC SET-UP
|
| id | nasplib_isofts_kiev_ua-123456789-78865 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1562-6016 |
| language | English |
| last_indexed | 2025-12-07T16:58:01Z |
| publishDate | 2006 |
| publisher | Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| record_format | dspace |
| spelling | Kosinov, A.V. Maslov, N. I. Naumov, S. V. Ovchinni, V. D. Starodubtsev, A. F. Vasilyev, G. P. Yalovenko, V. I. Bosisio, L. 2015-03-22T08:50:39Z 2015-03-22T08:50:39Z 2006 Development of technique for testing the long-term stability of silicon microstrip detectors / A.V. Kosinov, N. I. Maslov, S. V. Naumov, V. D. Ovchinnik, A. F. Starodubtsev,
 G. P. Vasilyev, V. I. Yalovenko,L. Bosisio // Вопросы атомной науки и техники. — 2006. — № 2. — С.163-165. — Бібліогр.:6 назв. — англ. 1562-6016 PACS: 29.40.Wk https://nasplib.isofts.kiev.ua/handle/123456789/78865 An automatic multi-channel set-up prototype for simultaneous testing of the Long-Term Stability (LTS)
 *
 of more
 than ten detectors is described. The Inner Tracking System of the ALICE experiment will include about two thousand
 Double-Sided Microstrip Detectors (DSMD). Efficient automatic measurement techniques are crucial for the
 LTS test, because the corresponding test procedure should be performed on each detector and requires long times, at
 least two days. By using special adapters for supporting and connecting the bare DSMDs, failing detectors can be
 screened out before module assembly, thus minimizing the cost. Automated probe stations developed for a special
 purpose or for microelectronics industry are used for measuring physical static DSMD characteristics and check
 good-to-bad element ratio for DSMD. However, automated (or semi-automatic) test benches for studying LTS or
 testing DSMD long-term stability before developing a detecting module are absent. Важная часть тестирования детектора и процедура определения гарантии качества состоит в изучении долговременной стабильности основных характеристик (ДСХ) детекторов, включая исследование эффектов влияния окружающей среды, таких как влажность или температура. В данной работе описаны метод тестирования и автоматический многоканальный стенд, специально разработанный для одновременного тестирования ДСХ более чем десяти детекторов Важлива частина тестування детектора і процедури визначення гарантії якості складається у вивченні
 довгострокової стабільності основних характеристик (ДСХ) детекторів, включаючи дослідження ефектів
 впливу навколишнього середовища, таких як вологість або температура. У даній роботі описані метод
 тестування та автоматичний стенд, спеціально розроблений для одночасного тестування ДСХ більш ніж
 десяти детекторів. Ця робота підтримана частково INTAS, проект № 03-55-964. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Применение ускорителей в радиационных технологиях Development of technique for testing the long-term stability of silicon microstrip detectors Усовершенствование методики тестирования долговременной стабильности кремниевых микростриповых детекторов Удосконалення методики тестування довгострокової стабільності кремнієвих мікростриповых детекторів Article published earlier |
| spellingShingle | Development of technique for testing the long-term stability of silicon microstrip detectors Kosinov, A.V. Maslov, N. I. Naumov, S. V. Ovchinni, V. D. Starodubtsev, A. F. Vasilyev, G. P. Yalovenko, V. I. Bosisio, L. Применение ускорителей в радиационных технологиях |
| title | Development of technique for testing the long-term stability of silicon microstrip detectors |
| title_alt | Усовершенствование методики тестирования долговременной стабильности кремниевых микростриповых детекторов Удосконалення методики тестування довгострокової стабільності кремнієвих мікростриповых детекторів |
| title_full | Development of technique for testing the long-term stability of silicon microstrip detectors |
| title_fullStr | Development of technique for testing the long-term stability of silicon microstrip detectors |
| title_full_unstemmed | Development of technique for testing the long-term stability of silicon microstrip detectors |
| title_short | Development of technique for testing the long-term stability of silicon microstrip detectors |
| title_sort | development of technique for testing the long-term stability of silicon microstrip detectors |
| topic | Применение ускорителей в радиационных технологиях |
| topic_facet | Применение ускорителей в радиационных технологиях |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/78865 |
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