Peculiarities of the bunch shape monitor operation for high-intensity electron beams
The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs t...
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| Опубліковано в: : | Вопросы атомной науки и техники |
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| Дата: | 2001 |
| Автори: | , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2001
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/79255 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Peculiarities of the bunch shape monitor operation for high-intensity electron beams / V.A. Moiseev, A.V. Feschenko // Вопросы атомной науки и техники. — 2001. — № 3. — С. 131-133. — Бібліогр.: 7 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1859895212132794368 |
|---|---|
| author | Moiseev, V.A. Feschenko, A.V. |
| author_facet | Moiseev, V.A. Feschenko, A.V. |
| citation_txt | Peculiarities of the bunch shape monitor operation for high-intensity electron beams / V.A. Moiseev, A.V. Feschenko // Вопросы атомной науки и техники. — 2001. — № 3. — С. 131-133. — Бібліогр.: 7 назв. — англ. |
| collection | DSpace DC |
| container_title | Вопросы атомной науки и техники |
| description | The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs the trajectories of secondary electrons, thus resulting in a degradation of phase resolution and in errors of phase position reading. Moreover there is a perturbation of the target potential due to the current compensating emission of the secondary electrons. The accuracy analysis has been carried out. The confident result to achieve the phase resolution less then one degree was obtained.
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| first_indexed | 2025-12-07T15:54:24Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-79255 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1562-6016 |
| language | English |
| last_indexed | 2025-12-07T15:54:24Z |
| publishDate | 2001 |
| publisher | Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| record_format | dspace |
| spelling | Moiseev, V.A. Feschenko, A.V. 2015-03-30T07:59:11Z 2015-03-30T07:59:11Z 2001 Peculiarities of the bunch shape monitor operation for high-intensity electron beams / V.A. Moiseev, A.V. Feschenko // Вопросы атомной науки и техники. — 2001. — № 3. — С. 131-133. — Бібліогр.: 7 назв. — англ. 1562-6016 PACS numbers: 29.27.Bd https://nasplib.isofts.kiev.ua/handle/123456789/79255 The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs the trajectories of secondary electrons, thus resulting in a degradation of phase resolution and in errors of phase position reading. Moreover there is a perturbation of the target potential due to the current compensating emission of the secondary electrons. The accuracy analysis has been carried out. The confident result to achieve the phase resolution less then one degree was obtained. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Peculiarities of the bunch shape monitor operation for high-intensity electron beams Особенности работы монитора формирователя пучков электронов высокой интенсивности Article published earlier |
| spellingShingle | Peculiarities of the bunch shape monitor operation for high-intensity electron beams Moiseev, V.A. Feschenko, A.V. |
| title | Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_alt | Особенности работы монитора формирователя пучков электронов высокой интенсивности |
| title_full | Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_fullStr | Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_full_unstemmed | Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_short | Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_sort | peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/79255 |
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