Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
A possibility of full irradiation tests of semiconductor detectors and microelectronics using electron accelerators are considered in the present work. The techniques for irradiation and for detector tests were described. The data on the efficiency of electron and bremsstrahlung action on the Si bul...
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| Опубліковано в: : | Вопросы атомной науки и техники |
|---|---|
| Дата: | 2001 |
| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2001
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/79269 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs / A.N. Dovbnya, N.I. Maslov, N.A. Dovbnya // Вопросы атомной науки и техники. — 2001. — № 3. — С. 164-166. — Бібліогр.: 12 назв. — англ. |
Репозитарії
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nasplib_isofts_kiev_ua-123456789-79269 |
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Dovbnya, A.N. Maslov, N.I. Dovbnya, N.A. 2015-03-30T08:32:03Z 2015-03-30T08:32:03Z 2001 Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs / A.N. Dovbnya, N.I. Maslov, N.A. Dovbnya // Вопросы атомной науки и техники. — 2001. — № 3. — С. 164-166. — Бібліогр.: 12 назв. — англ. 1562-6016 PACS numbers: 29.40.Wk https://nasplib.isofts.kiev.ua/handle/123456789/79269 A possibility of full irradiation tests of semiconductor detectors and microelectronics using electron accelerators are considered in the present work. The techniques for irradiation and for detector tests were described. The data on the efficiency of electron and bremsstrahlung action on the Si bulk material are presented. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs Исследование стойкости к излучению Si детекторов и микроэлектроники с использованием линейных ускорителей ННЦ ХФТИ Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs |
| spellingShingle |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs Dovbnya, A.N. Maslov, N.I. Dovbnya, N.A. |
| title_short |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs |
| title_full |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs |
| title_fullStr |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs |
| title_full_unstemmed |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs |
| title_sort |
radiation tolerance investigation of a si detectors and microelectronics using nsc kipt linacs |
| author |
Dovbnya, A.N. Maslov, N.I. Dovbnya, N.A. |
| author_facet |
Dovbnya, A.N. Maslov, N.I. Dovbnya, N.A. |
| publishDate |
2001 |
| language |
English |
| container_title |
Вопросы атомной науки и техники |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| format |
Article |
| title_alt |
Исследование стойкости к излучению Si детекторов и микроэлектроники с использованием линейных ускорителей ННЦ ХФТИ |
| description |
A possibility of full irradiation tests of semiconductor detectors and microelectronics using electron accelerators are considered in the present work. The techniques for irradiation and for detector tests were described. The data on the efficiency of electron and bremsstrahlung action on the Si bulk material are presented.
|
| issn |
1562-6016 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/79269 |
| citation_txt |
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs / A.N. Dovbnya, N.I. Maslov, N.A. Dovbnya // Вопросы атомной науки и техники. — 2001. — № 3. — С. 164-166. — Бібліогр.: 12 назв. — англ. |
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