Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs

A possibility of full irradiation tests of semiconductor detectors and microelectronics using electron accelerators are considered in the present work. The techniques for irradiation and for detector tests were described. The data on the efficiency of electron and bremsstrahlung action on the Si bul...

Full description

Saved in:
Bibliographic Details
Published in:Вопросы атомной науки и техники
Date:2001
Main Authors: Dovbnya, A.N., Maslov, N.I., Dovbnya, N.A.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2001
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/79269
Tags: Add Tag
No Tags, Be the first to tag this record!
Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs / A.N. Dovbnya, N.I. Maslov, N.A. Dovbnya // Вопросы атомной науки и техники. — 2001. — № 3. — С. 164-166. — Бібліогр.: 12 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862708954849607680
author Dovbnya, A.N.
Maslov, N.I.
Dovbnya, N.A.
author_facet Dovbnya, A.N.
Maslov, N.I.
Dovbnya, N.A.
citation_txt Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs / A.N. Dovbnya, N.I. Maslov, N.A. Dovbnya // Вопросы атомной науки и техники. — 2001. — № 3. — С. 164-166. — Бібліогр.: 12 назв. — англ.
collection DSpace DC
container_title Вопросы атомной науки и техники
description A possibility of full irradiation tests of semiconductor detectors and microelectronics using electron accelerators are considered in the present work. The techniques for irradiation and for detector tests were described. The data on the efficiency of electron and bremsstrahlung action on the Si bulk material are presented.
first_indexed 2025-12-07T17:14:01Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-79269
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1562-6016
language English
last_indexed 2025-12-07T17:14:01Z
publishDate 2001
publisher Національний науковий центр «Харківський фізико-технічний інститут» НАН України
record_format dspace
spelling Dovbnya, A.N.
Maslov, N.I.
Dovbnya, N.A.
2015-03-30T08:32:03Z
2015-03-30T08:32:03Z
2001
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs / A.N. Dovbnya, N.I. Maslov, N.A. Dovbnya // Вопросы атомной науки и техники. — 2001. — № 3. — С. 164-166. — Бібліогр.: 12 назв. — англ.
1562-6016
PACS numbers: 29.40.Wk
https://nasplib.isofts.kiev.ua/handle/123456789/79269
A possibility of full irradiation tests of semiconductor detectors and microelectronics using electron accelerators are considered in the present work. The techniques for irradiation and for detector tests were described. The data on the efficiency of electron and bremsstrahlung action on the Si bulk material are presented.
en
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
Вопросы атомной науки и техники
Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
Исследование стойкости к излучению Si детекторов и микроэлектроники с использованием линейных ускорителей ННЦ ХФТИ
Article
published earlier
spellingShingle Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
Dovbnya, A.N.
Maslov, N.I.
Dovbnya, N.A.
title Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
title_alt Исследование стойкости к излучению Si детекторов и микроэлектроники с использованием линейных ускорителей ННЦ ХФТИ
title_full Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
title_fullStr Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
title_full_unstemmed Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
title_short Radiation tolerance investigation of a Si detectors and microelectronics using NSC KIPT linacs
title_sort radiation tolerance investigation of a si detectors and microelectronics using nsc kipt linacs
url https://nasplib.isofts.kiev.ua/handle/123456789/79269
work_keys_str_mv AT dovbnyaan radiationtoleranceinvestigationofasidetectorsandmicroelectronicsusingnsckiptlinacs
AT maslovni radiationtoleranceinvestigationofasidetectorsandmicroelectronicsusingnsckiptlinacs
AT dovbnyana radiationtoleranceinvestigationofasidetectorsandmicroelectronicsusingnsckiptlinacs
AT dovbnyaan issledovaniestoikostikizlučeniûsidetektorovimikroélektronikisispolʹzovaniemlineinyhuskoriteleinnchfti
AT maslovni issledovaniestoikostikizlučeniûsidetektorovimikroélektronikisispolʹzovaniemlineinyhuskoriteleinnchfti
AT dovbnyana issledovaniestoikostikizlučeniûsidetektorovimikroélektronikisispolʹzovaniemlineinyhuskoriteleinnchfti