Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology”
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
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| Цитувати: | Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” / I.S. Bondarenko, A.A. Chmyga, G.N. Deshko, N.B. Dreval, S.M. Khrebtov, A.D. Komarov, A.S. Kozachek, L.I. Krupnik, I.S. Nedzelskiy // Вопросы атомной науки и техники. — 2002. — № 5. — С. 145-147. — Бібліогр.: 6 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
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Bondarenko, I.S. Chmyga, A.A. Deshko, G.N. Dreval, N.B. Khrebtov, S.M. Komarov, A.D. Kozachek, A.S. Krupnik, L.I. Nedzelskiy, I.S. 2015-03-30T09:31:43Z 2015-03-30T09:31:43Z 2002 Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” / I.S. Bondarenko, A.A. Chmyga, G.N. Deshko, N.B. Dreval, S.M. Khrebtov, A.D. Komarov, A.S. Kozachek, L.I. Krupnik, I.S. Nedzelskiy // Вопросы атомной науки и техники. — 2002. — № 5. — С. 145-147. — Бібліогр.: 6 назв. — англ. 1562-6016 PACS: 52.70.Nc https://nasplib.isofts.kiev.ua/handle/123456789/79285 This work was supported by STCU Grant № P-102. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Plasma diagnostics Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” Article published earlier |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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DSpace DC |
| title |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” |
| spellingShingle |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” Bondarenko, I.S. Chmyga, A.A. Deshko, G.N. Dreval, N.B. Khrebtov, S.M. Komarov, A.D. Kozachek, A.S. Krupnik, L.I. Nedzelskiy, I.S. Plasma diagnostics |
| title_short |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” |
| title_full |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” |
| title_fullStr |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” |
| title_full_unstemmed |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” |
| title_sort |
beam injection systems for the hibp plasma diagnostics of the ipp nsc “kharkov institute of physics and technology” |
| author |
Bondarenko, I.S. Chmyga, A.A. Deshko, G.N. Dreval, N.B. Khrebtov, S.M. Komarov, A.D. Kozachek, A.S. Krupnik, L.I. Nedzelskiy, I.S. |
| author_facet |
Bondarenko, I.S. Chmyga, A.A. Deshko, G.N. Dreval, N.B. Khrebtov, S.M. Komarov, A.D. Kozachek, A.S. Krupnik, L.I. Nedzelskiy, I.S. |
| topic |
Plasma diagnostics |
| topic_facet |
Plasma diagnostics |
| publishDate |
2002 |
| language |
English |
| container_title |
Вопросы атомной науки и техники |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| format |
Article |
| issn |
1562-6016 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/79285 |
| citation_txt |
Beam injection systems for the HIBP plasma diagnostics of the IPP NSC “Kharkov Institute of Physics and Technology” / I.S. Bondarenko, A.A. Chmyga, G.N. Deshko, N.B. Dreval, S.M. Khrebtov, A.D. Komarov, A.S. Kozachek, L.I. Krupnik, I.S. Nedzelskiy // Вопросы атомной науки и техники. — 2002. — № 5. — С. 145-147. — Бібліогр.: 6 назв. — англ. |
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2025-11-25T23:07:21Z |
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2025-11-25T23:07:21Z |
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| fulltext |
PLASMA DIAGNOSTICS
BEAM INJECTION SYSTEMS FOR THE HIBP PLASMA DIAGNOSTICS
OF THE IPP NSC “KHARKOV INSTITUTE OF PHYSICS AND
TECHNOLOGY”
I.S. Bondarenko, A.A. Chmyga, G.N. Deshko, N.B. Dreval, S.M. Khrebtov,
A.D. Komarov, A.S. Kozachek, L.I. Krupnik
Institute of Plasma Physics, National Scientific Centre “Kharkov Institute of Physics and
Technology”, 61108 Kharkov, Ukraine
I.S. Nedzelskiy
Associação EURATOM/IST, Centro de Fusão Nuclear, Instituto Superior Técnico, 1049-001
Lisboa, Portugal
PACS: 52.70.Nc
1. INTRODUCTION
Among a lot of contactless methods the plasma
corpuscular diagnostics one takes from leading places.
With the help of plasma probing by ion and neutral beams
it is possible to receive information about space
distribution of a potential, density, plasma electron
temperature, impurity ions and poloidal magnetic field
(axial current) space distributions in plasma of modern
fusion devices. Now we have two main directions of
plasma corpuscular diagnostics – heavy ion beam probing
(HIBP) [1] and light atomic beam probing diagnostic
systems (BES) [2].
The heavy ion beam probing diagnostic systems
allow obtaining information about the plasma potential
space distribution, density, and electron temperature and
plasma axial current distribution. This method is based on
the heavy ion (Cs or Tl) beam injection in a plasma
volume and the secondary ion beam current and energy
registration usually by means of a 300 Proca–Green
electrostatic energy analyzer. This diagnostics required
high accuracy of primary and secondary ion beams energy
measurements and high stability (not less than 10-5) of ion
beam energy, so the injector and analyzer power supplies
voltage.
The easy neutral beam diagnostics based on Li or
Na beam injection in plasma volume and registration a
spectral characteristics of a probing beam radiation allows
investigating plasma and impurity ions density space
distribution in peripheral area of modern thermonuclear
devices. This method has a potential possibility to measure
poloidal and toroidal magnetic fields. This diagnostics
required high intensity of the probing beam (up to 10 mA),
but not so high stability of beam energy.
The corpuscular diagnostic systems consist of
two main parts – an injector of a primary beam and
analyzing device of a secondary signal from plasma. A
main task of an injector, for all types of diagnostic
complexes, is to supply a probing beam density in
researched area of plasma sufficient for reliable
registration of a secondary signal. The injector is also
consists of two parts the emitter-extractor unit (ion
source) and a shaping-focusing system.
2. EMITTER-EXTRACTOR UNIT AND
SHAPING-FOCUSING SYSTEM
The emitter-extractor unit scheme is shown at Fig.1.
This quasipierce emitter-extractor unit was elaborated in
IPP NSC KIPT and is using now (with not significant
modifications) in injectors of HIBP diagnostic complexes
of modern fusion devices, such as TJ-II (CIEMAT,
Spain), Т-10 (RSC, Russia), ТUМАN-3М (PhTI, Russia),
ISTTOK (CFN/IST, Portugal), and in light neutral beam
injector (BES) at ASDEX Upgrade tokamak, (IPP,
Germany).
This design allows rather simple changing of the
emitter (3) and heating filament (4).
Fig.1. Ion injector emitter–extractor unit:
1. Extractor electrode
2. Pierce electrode
3. Solid state thermo ionic emitter
4. Heating filament
5. Filament enclose
6. Filament holder
7. Emitter flange
Problems of Atomic Science and Technology. 2002. № 5. Series: Plasma Physics (8). P. 145-147 145
The calculations and experimental investigations of this
unit shows, that in order to obtain maximum ion current,
without ion current to the extractor, it’s necessary to have
the following relations between electrode dimensions:
Dextr= dem-extr (1),
Dext / dem =1.5 (2),
where
Dextr - extractor hole diameter;
dem – emission surface diameter;
dem-extr -emitter-extractor gap.
In this case Chaild – Lengmour law for flat diode can
describe the relationship between ion current density and
extractor voltage:
2
2/3
81054,5
d
Uj
⋅
⋅= −
µ
, (3),
where d = dem-extr , µ - ion atomic mass.
The optimal extractor cone angle (1) is 900,
pierce electrode - 1200. The pierce electrode (2) may have
an electrical contact with emitter surface, or may be no –
in that case one can apply the positive potential to it
(some hundred volts) to plug out the ion beam.
Solid-state thermo ionic emitters (3), elaborated in
IPP NSC KIPT consists of metal (Ta, W) support with
backing emitter material – alkali ion aluminosilicate (Li,
Na, K, Cs) [3, 4], we use also ceolite for Tl, and Cs.
These emitters allow obtaining the ion current density in
steady state mode up to 10 mА/сm2 and some А/сm2 in
pulse mode. Working resource – 25 mА.hour/gram.
A shaping-focusing system based on multy-electrode
accelerating tube with potential distribution which allows
to have soft operation of ion beam focusing point.
3. INJECTOR SYSTEMS
Fig. 2 presents the ion injector for HIBP system of
TI-II fusion device [5].
Fig.2. Cs + HIBP diagnostic system injector of TJ-II
stellarator:
1. Emitter–extractor unit
2. Focusing electrode
3. Accelerating tube
4. Faraday cup
5. Deflecting plates
6. Wire detector
The space potential distribution, which necessary
for ion beam accelerating and focusing into determined
point of stellarator plasma was assigned by resistive
divider of accelerating tube. The initial ion beam focusing
is carried out by three-electrode lens, consists of extractor
electrode, focusing electrode (2), and some first rings of
accelerating tube (3), after that the ion beam is
accelerating to determined energy. Ion current and focus
distance control is carried out by means of extractor
potential and emitter temperature (filament current).
Injector power supply, elaborated in IPP NSC
KIPT, consists of 4 sources: accelerating voltage
(+200кV, 1 mА), extracting voltage (-4 кV, 1 mА),
modulation voltage (+600 V, 1 mА), emitter filament
heating voltage (12 V, 15 А), assembled in a mutual box.
This power supply guarantee high stability of accelerating
voltage (not worse than 10-5), which is necessary for
plasma potential measurements by HIBP method.
Ion current measurements carried out by Faraday
cup (4). The FC design allows to measure the ion current
between stellarator pulses and to transmit ion beam to
plasma in determined period of time. This design prevents
ion beam coming into stellarator vacuum chamber during
a period of magnetic field arising, then consists a
conditions for run away electron current appearance. This
current appears due to a secondary ion-electron emission
from vacuum chamber wall and leads to plasma discharge
breakdown.
The ion beam space control is carrying out by
deflecting plates (5), and beam profile measurements - by
wire detector (6).
This injector allows to having primary Cs ion
beam current up to 100 mkA with beam diameter 4 mm.
It’s more than enough for steady secondary ion beam
registration. The secondary ion current on analyzer
detector plates is now 100 – 300 nA, it’s 2 order of
magnitude more than plasma loading.
The same types of injectors are working now at
HIBP diagnostic systems of tokamaks Т-10 (300 кV,
30mкА, Tl+ beam), ТUМАN-3М (80 кV, 80 mкА, K+
beam) and ISTTOK.
Fig.3 shows potential distribution in HIBP
injector of ISTTOK tokamak [6], one can see the initial
ion beam focusing area by three-electrode lens (I – III)
and accelerating area (IV).
146
Fig.3. Potential space distribution in ISTTOK tokamak
injector
ISTTOK injector system can operate with two
mutually replacing ion sources– solid state and plasma
sources. Plasma ion source allows injecting into plasma
practically any kind of ions and also two or more
component ion beams with the aim of plasma electron
temperature measurements. With Cs+ solid-state source
this injector produces up to 20 mkA, 20 keV beam with
3mm diameter and 1,7 mrad divergence at 1,3 m from the
accelerating tube. It can operate with a mono-cusp plasma
ion souce also, and produces up to 40 mkA Xe+ beam
with the same 3 mm diameter but 16-mrad divergence.
The respective current-to-voltage characteristics are
shown in Fig.4.
Fig.4. ISTTOK injector current-to-voltage characteristics
MPIS – mono-cusp plasma ion source,
SSTS –solid-state thermo ionic source,
a – emitter diameter, d – emitter extractor gap
4. CONCLUSION
A long – focus primary ion beam HIBP injectors
described in this report. They were based on accelerating
tubes with resistively dividers. These systems have a
possibility of a soft control of focusing distance and
primary beam density by means of extractor voltage
control. This feature is very important for supplying a
probing beam density in researched area of plasma
sufficient for reliable registration of a secondary signal.
Now authors are working under new types of
emitter – extractor units, based on Li and Na solid state
thermo ionic emitters in order to obtain ion current up to
several dozen milliamps for beam - emission spectroscopy
(BES), and several – component ion beams for plasma
electron temperature measurements by HIBP method.
This work was supported by STCU Grant № P-102.
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