Orientation effects in ultrarelativistic electron transmission through a single crystal

The results of experimental investigations of the 1.2 GeV electron transmission dynamics in a thin single crystal of Si are discussed. The interpretation of the electron scattering orientation dependencies measured under different scattering angles is carried out. The existence of scattering directi...

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Veröffentlicht in:Вопросы атомной науки и техники
Datum:2001
Hauptverfasser: Blazhevich, S.V., Bochek, G.L., Kulibaba, V.I., Maslov, N.I., Shramenko, B.I.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2001
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/79472
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Orientation effects in ultrarelativistic electron transmission through a single crystal / S.V. Blazhevich, G.L. Bochek, V.I. Kulibaba, N.I. Maslov, B.I. Shramenko // Вопросы атомной науки и техники. — 2001. — № 6. — С. 144-146. — Бібліогр.: 5 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:The results of experimental investigations of the 1.2 GeV electron transmission dynamics in a thin single crystal of Si are discussed. The interpretation of the electron scattering orientation dependencies measured under different scattering angles is carried out. The existence of scattering direction, where one can observe the scattering intensity independence on the crystallographic plane orientation is shown. Besides the existence of crystallographic axis orientation, where one can observe the region of uniform angle distribution of scattering intensity, is shown.
ISSN:1562-6016