Temperature effect on the characteristics and lifetime of semiconductor detectors

• Published in: Вопросы атомной науки и техники
• Date: 2006
• Main Authors: Vasiliyev, G.P., Kosinov, A.V., Kulibaba, V.I., Maslov, N.I., Naumov, S.V., Ovchinnik, V.D., Yalovenko, V.I.
• Format: Article
• Language: English
• Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2006
• Subjects: Применение ускорителей в радиационных технологиях
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/79871
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Temperature effect on the characteristics and lifetime of semiconductor detectors / G.P. Vasiliyev, A.V. Kosinov, V.I. Kulibaba, N.I. Maslov, S.V. Naumov, V.D. Ovchinnik, V.I. Yalovenko // Вопросы атомной науки и техники. — 2006. — № 3. — С. 137-139. — Бібліогр.: 11 назв. — англ.

The paper reports the results from studies into the effect of temperature on the performance characteristics of planar silicon detectors designed and manufactured at the NSC KIPT. A variety of techniques are demonstrated for measuring the temperature effect on various static and spectral character...