Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments

• Date: 2014
• Main Authors: Skladnik-Sadowska, E., Kwiatkowski, R., Malinowski, K., Sadowski, M.J., Czaus, K., Zaloga, D., Żebrowski, J., Nowakowska-Langier, K., Kubkowska, M., Paduch, M., Scholz, M., Zielinska, E., Ladygina, M.S., Garkusha, I.E., Gribkov, V.A., Demina, E.V., Maslyaev, S.A., Pimenov, V.N.
• Format: Article
• Language: English
• Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2014
• Series: Вопросы атомной науки и техники
• Subjects: Динамика плазмы и взаимодействие плазма-стенка
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/81200
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments / E. Skladnik-Sadowska, R. Kwiatkowski, K. Malinowski, M.J. Sadowski, K. Czaus, D. Zaloga, J. Żebrowski, K. Nowakowska-Langier, M. Kubkowska, M. Paduch, M. Scholz, E. Zielinska, M.S. Ladygina, I.E. Garkusha, V.A. Gribkov, E.V. Demina, S.A. Maslyaev, V.N. Pimenov // Вопросы атомной науки и техники. — 2014. — № 6. — С. 72-75. — Бібліогр.: 7 назв. — англ.

The paper presents results of experimental research on emission of the visible radiation (VR) from intense deuterium plasma streams propagating freely within a vacuum chamber or interacting with silicon-carbide (SiC) targets. The investigated pulsed plasma streams were generated by high-current discharges realized within two facilities of the Plasma-Focus (PF) type, i.e. within the PF-1000U facility operated at the IFPiLM and the PF-360U device operated at the NCBJ. Detailed measurements have been carried out using optical emission spectroscopy (OES) technique. Parameters of plasma were estimated from the Dα line only. Structural changes of the irradiated SiC targets were analyzed by means of a scanning electron microscope (SEM) and energy dispersive X-ray spectrometer (EDS).