Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments
The paper presents results of experimental research on emission of the visible radiation (VR) from intense deuterium plasma streams propagating freely within a vacuum chamber or interacting with silicon-carbide (SiC) targets. The investigated pulsed plasma streams were generated by high-current disc...
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2014
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| Cite this: | Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments / E. Skladnik-Sadowska, R. Kwiatkowski, K. Malinowski, M.J. Sadowski, K. Czaus, D. Zaloga, J. Żebrowski, K. Nowakowska-Langier, M. Kubkowska, M. Paduch, M. Scholz, E. Zielinska, M.S. Ladygina, I.E. Garkusha, V.A. Gribkov, E.V. Demina, S.A. Maslyaev, V.N. Pimenov // Вопросы атомной науки и техники. — 2014. — № 6. — С. 72-75. — Бібліогр.: 7 назв. — англ. |
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nasplib_isofts_kiev_ua-123456789-812002025-02-09T14:42:50Z Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments Исследования взаимодействия интенсивных дейтериевых плазменных потоков с SiC-мишенями в экспериментах на плазма-фокусе Дослідження взаємодії інтенсивних дейтерієвих плазмових потоків з SiC-мішенями в експериментах на плазма-фокусі Skladnik-Sadowska, E. Kwiatkowski, R. Malinowski, K. Sadowski, M.J. Czaus, K. Zaloga, D. Żebrowski, J. Nowakowska-Langier, K. Kubkowska, M. Paduch, M. Scholz, M. Zielinska, E. Ladygina, M.S. Garkusha, I.E. Gribkov, V.A. Demina, E.V. Maslyaev, S.A. Pimenov, V.N. Динамика плазмы и взаимодействие плазма-стенка The paper presents results of experimental research on emission of the visible radiation (VR) from intense deuterium plasma streams propagating freely within a vacuum chamber or interacting with silicon-carbide (SiC) targets. The investigated pulsed plasma streams were generated by high-current discharges realized within two facilities of the Plasma-Focus (PF) type, i.e. within the PF-1000U facility operated at the IFPiLM and the PF-360U device operated at the NCBJ. Detailed measurements have been carried out using optical emission spectroscopy (OES) technique. Parameters of plasma were estimated from the Dα line only. Structural changes of the irradiated SiC targets were analyzed by means of a scanning electron microscope (SEM) and energy dispersive X-ray spectrometer (EDS). Представлены результаты экспериментальных исследований по эмиссии видимого излучения из интенсивных дейтериевых плазменных потоков свободно распространяющихся в вакуумной камере или взаимодействующих с SiC-мишенями. Исследуемые импульсные плазменные потоки генерировались высокоточными разрядами на двух установках типа плазменный фокус (ПФ). А именно, установка PF-1000U, работающая в IFPiLM, и PF-360U, работающая в NCBJ. Детальные измерения были проведены с использованием оптической эмиссионной спектроскопии (ОЭС). Параметры плазмы были оценены из Dα-линии. Структурные изменения облучаемых SiC-образцов были проанализированы с помощью сканирующего электронного микроскопа (СЭM) и энергии рентгеновского спектрометра (ЭРС). Представлено результати експериментальних досліджень з емісії видимого випромінювання з інтенсивних дейтерієвих плазмових потоків, що вільно розповсюджуються у вакуумній камері чи взаємодіють з SiC-мішенями. Імпульсні плазмові потоки, що досліджувались, генерувались високоточними розрядами на двох установках типу плазмовий фокус (ПФ). А саме, установка PF-1000U, що функціонує в IFPiLM, та PF-360U – у NCBJ. Детальні вимірювання були проведені за допомогою оптичної емісіонної спектроскопії (OEС). Параметри плазми були оцінені з Dα-лінії. Структурні зміни опромінених SiC-мішеней проаналізовані за допомогою скануючого електронного мікроскопа (СEM) та енергії рентгенівського спектрометра (EРС). 2014 Article Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments / E. Skladnik-Sadowska, R. Kwiatkowski, K. Malinowski, M.J. Sadowski, K. Czaus, D. Zaloga, J. Żebrowski, K. Nowakowska-Langier, M. Kubkowska, M. Paduch, M. Scholz, E. Zielinska, M.S. Ladygina, I.E. Garkusha, V.A. Gribkov, E.V. Demina, S.A. Maslyaev, V.N. Pimenov // Вопросы атомной науки и техники. — 2014. — № 6. — С. 72-75. — Бібліогр.: 7 назв. — англ. 1562-6016 PACS: 52.59.Hq, 52.70.Kz, 52.30.-q, 52.40.Hf https://nasplib.isofts.kiev.ua/handle/123456789/81200 en Вопросы атомной науки и техники application/pdf Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Динамика плазмы и взаимодействие плазма-стенка Динамика плазмы и взаимодействие плазма-стенка |
| spellingShingle |
Динамика плазмы и взаимодействие плазма-стенка Динамика плазмы и взаимодействие плазма-стенка Skladnik-Sadowska, E. Kwiatkowski, R. Malinowski, K. Sadowski, M.J. Czaus, K. Zaloga, D. Żebrowski, J. Nowakowska-Langier, K. Kubkowska, M. Paduch, M. Scholz, M. Zielinska, E. Ladygina, M.S. Garkusha, I.E. Gribkov, V.A. Demina, E.V. Maslyaev, S.A. Pimenov, V.N. Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments Вопросы атомной науки и техники |
| description |
The paper presents results of experimental research on emission of the visible radiation (VR) from intense deuterium plasma streams propagating freely within a vacuum chamber or interacting with silicon-carbide (SiC) targets. The investigated pulsed plasma streams were generated by high-current discharges realized within two facilities of the Plasma-Focus (PF) type, i.e. within the PF-1000U facility operated at the IFPiLM and the PF-360U device operated at the NCBJ. Detailed measurements have been carried out using optical emission spectroscopy (OES) technique. Parameters of plasma were estimated from the Dα line only. Structural changes of the irradiated SiC targets were analyzed by means of a scanning electron microscope (SEM) and energy dispersive X-ray spectrometer (EDS). |
| format |
Article |
| author |
Skladnik-Sadowska, E. Kwiatkowski, R. Malinowski, K. Sadowski, M.J. Czaus, K. Zaloga, D. Żebrowski, J. Nowakowska-Langier, K. Kubkowska, M. Paduch, M. Scholz, M. Zielinska, E. Ladygina, M.S. Garkusha, I.E. Gribkov, V.A. Demina, E.V. Maslyaev, S.A. Pimenov, V.N. |
| author_facet |
Skladnik-Sadowska, E. Kwiatkowski, R. Malinowski, K. Sadowski, M.J. Czaus, K. Zaloga, D. Żebrowski, J. Nowakowska-Langier, K. Kubkowska, M. Paduch, M. Scholz, M. Zielinska, E. Ladygina, M.S. Garkusha, I.E. Gribkov, V.A. Demina, E.V. Maslyaev, S.A. Pimenov, V.N. |
| author_sort |
Skladnik-Sadowska, E. |
| title |
Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments |
| title_short |
Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments |
| title_full |
Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments |
| title_fullStr |
Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments |
| title_full_unstemmed |
Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments |
| title_sort |
research on interactions of intense deuterium plasma streams with sic targets in plasma-focus experiments |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| publishDate |
2014 |
| topic_facet |
Динамика плазмы и взаимодействие плазма-стенка |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/81200 |
| citation_txt |
Research on interactions of intense deuterium plasma streams with SiC targets in plasma-focus experiments / E. Skladnik-Sadowska, R. Kwiatkowski, K. Malinowski, M.J. Sadowski, K. Czaus, D. Zaloga, J. Żebrowski, K. Nowakowska-Langier, M. Kubkowska, M. Paduch, M. Scholz, E. Zielinska, M.S. Ladygina, I.E. Garkusha, V.A. Gribkov, E.V. Demina, S.A. Maslyaev, V.N. Pimenov // Вопросы атомной науки и техники. — 2014. — № 6. — С. 72-75. — Бібліогр.: 7 назв. — англ. |
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Вопросы атомной науки и техники |
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ISSN 1562-6016. ВАНТ. 2014. №6(94)
72 PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. 2014, №6. Series: Plasma Physics (20), p. 72-75.
RESEARCH ON INTERACTIONS OF INTENSE DEUTERIUM PLASMA
STREAMS WITH SiC TARGETS IN PLASMA-FOCUS EXPERIMENTS
E. Skladnik-Sadowska
1
, R. Kwiatkowski
1
, K. Malinowski
1
, M.J. Sadowski
1-2
, K. Czaus
1
,
D. Zaloga
1
, J. Żebrowski
1
, K. Nowakowska-Langier
1
, M. Kubkowska
2
, M. Paduch
2
,
M. Scholz
5
, E. Zielinska
2
, M.S. Ladygina
3
, I.E. Garkusha
3
, V.A. Gribkov
4
,
E.V. Demina
4
, S.A. Maslyaev
4
, V.N. Pimenov
4
1
National Centre for Nuclear Research (NCBJ), Otwock, Poland;
2
Institute of Plasma Physics and Laser Microfusion (IFPiLM), Warsaw, Poland;
3
Institute of Plasma Physics NSC KIPT, Kharkov, Ukraine;
4
The A.A. Baikov Institute of Metallurgy and Material Science, Moscow, Russia;
5
The H. Niewodniczanski Institute of Nuclear Physics, PAS, Cracow, Poland
The paper presents results of experimental research on emission of the visible radiation (VR) from intense
deuterium plasma streams propagating freely within a vacuum chamber or interacting with silicon-carbide (SiC)
targets. The investigated pulsed plasma streams were generated by high-current discharges realized within two
facilities of the Plasma-Focus (PF) type, i.e. within the PF-1000U facility operated at the IFPiLM and the PF-360U
device operated at the NCBJ. Detailed measurements have been carried out using optical emission spectroscopy
(OES) technique. Parameters of plasma were estimated from the D line only. Structural changes of the irradiated
SiC targets were analyzed by means of a scanning electron microscope (SEM) and energy dispersive X-ray
spectrometer (EDS).
PACS: 52.59.Hq, 52.70.Kz, 52.30.-q, 52.40.Hf
INTRODUCTION
Investigation of plasma-surface interactions and
associated processes is of primary importance for
further development of plasma physics and technology.
Experimental studies are carried out in this direction at
many laboratories with the use of various plasma
sources, including plasma-focus (PF) facilities [1-3].
Among different materials of interest for fusion
technology there is also a silicon-carbide (SiC). Hence,
it is of interest to study a SiC target behavior under
irradiation by powerful plasma-ion streams, and in
particular investigate carbon- and silicon-lines emitted
from plasma created near the target surface. Preliminary
studies of SiC targets have already performed earlier
within the modified PF-1000U facility in Warsaw [4].
Some new studies have recently been carried out within
the modified PF-360U facility in Otwock-Swierk. The
main aim of this paper has been to compare results of
research on SIC targets in the PF-1000U and PF-360U
experiments.
1. EXPERIMENTS WITHIN PF-1000U
To investigate interactions of powerful plasma
streams, with SiC samples, the use was first of the
modified PF-1000U facility. It generated intense plasma
streams (jets) of an averaged density equal to about
10
17
cm
-3
and velocity of about 10
7
cm/s, as measured at
a distance of 9 cm from the electrodes outlets. Those
streams contained also fast deuteron beams of energies
from about 80 keV to several hundreds keV, and
sometimes even to several megaelectron volt [5,6].
Energy spectra of deuteron beams had the maximum in
the range of 100-200 keV. The flux density of deuterons
> 380 keV amounted to about 2.4 x 10
9
cm
-2
, while >
700 keV it was about 10
9
cm
-2
. The facility was
equipped with a 230 mm-i.d. inner electrode made of
copper, with a central 50 mm-i.d. tungsten insert.
In order to investigate the interaction of such streams
with SiC targets, the use was made of the optical
emission spectroscopy (OES) technique. The optical
measurements were carried out side-on by means of a
quartz collimator and an optical-fibre cable coupled
with a Mechelle
®
900 spectrometer, as shown in Fig. 1.
Fig. 1. Electrodes of the PF-1000U facility with the
experimental set-up for OES and time-integrated
visible-radiation (VR) pictures of a discharge
The Mechelle
®
900 spectrometer was equipped with a
PCO SensiCam camera and software needed for an
analysis of recorded optical spectra. The OES studies
were started with the measurements of a free-
propagating plasma stream, i.e. without any target.
During 380 kJ discharges the main plasma-ion pulse
lasted about 0.2 µs, and its intensity decayed in several
tens µs. The optical spectra of the free-propagating
plasma stream showed that it emitted intense Balmer
lines of the working gas (D and D ) and many spectral
lines from the electrode materials (mainly Cu), as
shown in Fig. 2 (top).
10 cm
ISSN 1562-6016. ВАНТ. 2014. №6(94) 73
Fig. 2. Comparison of VR spectra recorded at different
instants of PF-1000U discharges without any target
(top) and with a SiC-target (bottom)
In the next step, a SiC target (1 cm
3
cube) was placed at a
distance of 9 cm from the electrode ends, and a series of
discharges was performed. Each plasma-ion stream induced
some erosion of the irradiated SiC sample and produced a
plasma layer in front of the target. A power- flux density
upon the target surface from each plasma stream reached
10
9
...10
10
W/cm
2
, and that from fast ions beams amounted to
10
12
W/cm
2
[4]. Optical spectra, as recorded at different
time delays after so-called “current dip”, were analyzed to
identify Si- and C-lines. The Balmer lines from the working
gas, i.e., D , D and D could not be used for a quantitative
analysis because of strong re-absorption effects. The
recorded spectra contained intense Si-ion lines, e.g. Si I
579.5...615.5 nm, Si II 412.8...678.4 nm, Si III
380.6...456.7 nm and Si IV 314.9 nm. There were also
identified intense C-lines, ranging from C II
426.7...723.1 nm to C IV 580.1 nm. During the first phase of
the plasma-target interaction (in about 2 s) the emission of
Si III, Si IV, C III and C IV lines was observed, while at
larger delays the spectra showed Si II and C II lines only.
The optical emission of plasma produced from the irradiated
SiC target decayed in about 10 s.
Fig. 3. Images of the surfaces of the virgin SiC sample
(left) and irradiated sample № 9 (right), as obtained by
means of SEM technique
The irradiated SiC samples were later subject to a
detailed surface-analysis by means of SEM and EDS
techniques. SEM images of the virgin SiC sample and
irradiated sample are shown in Fig. 3. From a
comparison of the presented images one could see that
the irradiation of the SiC samples resulted in fritting of
the surface layers of the carbide phase and in the
production of droplets of sizes from several to tens m.
Thermal stresses resulted in the formation of relatively
long cracks in the sample surface layer. The observed
macro-particles resulted from the evaporation and
sputtering of the SiC target surface and as well as some
erosion of the PF-1000U electrodes and the sample
holder, that led to deposition of the eroded materials.
The SEM pictures of the virgin and irradiated
samples were also compared with images obtained by
means of EDS. It enabled a distribution of different
elements to be determined, as shown in Fig. 4.
Fig. 4. EDS mapping of the sample № 9, which shows a
distribution of silicon and carbon
To identify various elements on the irradiated
samples the use was also made of the EDS technique.
For a virgin sample there were recorded characteristic
lines of primary materials, i.e., C and Si only. For the
irradiated samples, in addition to those lines one could
also identify lines corresponding to other elements (such
as Cu, Fe, Al and O), as shown in Fig. 5.
Fig. 5. Characteristic lines of elements, as obtained
with EDS for the sample irradiated in PF-1000U
The admixtures of the other elements originated from
the electrodes and constructional parts of the PF-1000U
chamber, but their concentration within the irradiated
surface layer was low.
2. EXPERIMENTS WITHIN PF-360U
The second part of the described studies was performed
within the modified PF-360U facility equipped with
Mather-type coaxial electrodes made of copper-tubes [7].
A background pressure was equal to 6 mbar D2, the
charging voltage of a condenser bank was 30 kV, and
energy supplied to PF discharges amounted to about
125 kJ. The maximum discharge current reached about
1.5 MA, and the pulsed plasma streams were emitted
mainly during the current peculiarity (dip), which occurred
about 5 s after the discharge initiation. The investigate a
SiC sample (1 cm
3
cube) was placed on the symmetry
20 m
350 400 450 500 550 600 650 700 750
0
1000
2000
3000
4000
5000
6000
7000
8000
Si II
Si II
D
Fe I
Fe I
C II
shots 9599, 9602, 9604 - 9607
U
0
= 24 kV, p
0
= 1.4 hPa
z = 9 cm, t
exp
= 0.1 s
PF-1000, target SiC #8 &# 9
tim
e to
d
ip
s
0.0
4.0
3.0
2.0
1.0
-1.0
wavelength, nm
In
te
n
s
it
y
, c
o
u
n
ts
Si IV
Si III
Si I
C IV
C III
C II
D
D
D
Si III Si III
Si II
Si II
D Si II
450 500 550 600 650 700
0
100
200
300
400
500
D
D
D
CuI, CuII
CuI, CuII
D
D CII
PF-1000 (Cu&W)
U
o
=24 kV, p
o
=1.4 hPa
z=9 cm, 90
o
, t
exp
=0.1 s
in
te
ns
ity
,
a.
u.
tim
e
to
d
ip
s
7.0
5.0
wavelenght, nm
-0.1
0.05
1.0
CuI, CuII D
D
D
Sample № 9
carbon (red)
silicon (green)
100 m
74 ISSN 1562-6016. ВАНТ. 2014. №6(94)
axis of the PF-360U electrodes in a stainless-steel holder,
which was designed to prevent a deposition of its material
upon the irradiated sample surface.
The OES measurements were carried out mostly at a
distance of 9 cm from electrode outlets. The use was
made of a side-on quartz window and an optical
collimator, which was coupled through a fibre-cable with
a Mechelle
®
900 spectrometer, as in the case of the
previous studies [4]. The SiC target was oriented
perpendicularly to direction of the plasma-ion stream
motion, as shown in Fig. 6.
Fig. 6. Picture of PF-360U electrodes and the target
Temporal changes of the optical spectrum emitted
from a free propagating plasma stream, which were
recorded during the PF-360U discharge without any
target, are presented in Fig. 7 (top). Those spectra show
that the free plasma-ion stream was relatively clean and
it contained a low quantity of impurities.
Fig. 7. Comparison of the visible radiation (VR) spectra
recorded at different instants of the PF-360U discharge
without any target (top) and with the SiC -target
(bottom)
In the step the OES measurements were performed
during expositions of the investigated SiC target. Some
optical spectra, as measured perpendicularly to the z-
axis, are shown in Fig. 7 (bottom). In this case the
recorded spectra show that plasma, generated by
interactions of the primary plasma-ion stream with the
target, was cumulated at the target surface for about 0.3
s. That plasma emitted intense deuterium lines (D , D
and D ), which showed strong re-absorption effects.
The identification of other spectral lines was impossible.
In later phases one could however identify C II, Si II, Si
III and Fe I lines. During the first period the strong re-
absorption of the D-lines made it impossible a
quantitative assessment of deuterium plasma density.
Important information might be gained from a direct
analysis of the irradiated SiC target surface. It was
investigated by means of SEM, as shown in Fig. 8.
Fig. 8. SEM images of the surface of the SiC sample
№ 6 irradiated within PF-360U
In some cases a very strong erosion effects upon the
irradiated target surface, and even micro-droplets of the
melted target material were observed. In order to
investigate an elemental composition of the irradiated
target surface the use was made of the energy-dispersive
X-ray spectroscopy (EDS) technique, as shown in Fig. 9.
Fig. 9. EDS mapping showing a distribution of silicon
and carbon upon sample No. 6, which was irradiated in
the PF-360U facility
In general, the EDS mapping images obtained from
the irradiated SiC samples differed considerably from
those recorded for the virgin samples. There were
observed many regions of high concentration of silicon,
and a smaller amount of micro-zones of high
concentration of carbon, probably as graphite
inclusions. After the sample irradiation the total quantity
of the carbon upon the sample surface was decreased,
and the silicon distribution became almost uniform.
More accurate information could be gained from the
EDS diagrams, a shown in Fig. 10.
Fig. 10. Characteristic lines of various elements that
were recorded with EDS of the irradiated sample
surface
350 400 450 500 550 600 650 700
0
100
200
300
400
500
D
D
PF-360U free stream
U
o
= 30 kV, p
o
= 6.6 mbar D
2
z = 9 cm, texp = 0.1 s
20140702 shots 2-6
4.0
1.9
1.0
0.3
0
tim
e
af
te
r
d
ip
,
s
wavelength, nm
In
te
n
s
it
y
,
a
.u
.
D
350 400 450 500 550 600 650 700
0
250
500
750
1000
1250
D
D
Si II
Si II
Si III
Si II
D
D
PF-360U & SiC
U
o
= 30 kV, p
o
= 6.5 mbar D
2
z = 9 cm, texp = 0.1 s
20140625 shots 5-7
wavelength, nm
in
te
n
s
it
y
,
a
.u
.
1.1
4.0
2.0
0.3
tim
e
af
te
r
dip
,
s
D
C II
Fe I C II
Sample No. 6
carbon (red)
silicon (green)
100 m
50 m
_____
____
10 m
_____
_
____
ISSN 1562-6016. ВАНТ. 2014. №6(94) 75
In the total spectrum of elements observed upon the
surface of the samples irradiated within the PF-360U
facility, besides basic components of the material under
investigation (i.e. Si and C) one may identify traces of
of other elements, as copper (Cu) and oxygen (O).
Those elements were possibly evaporated from surfaces
of the PF-360U insulator and electrodes, as well as from
some construction parts of the vacuum chamber. They
were subsequently precipitated by the target surface
from a vapor phase.
SUMMARY AND CONCLUSIONS
The most important results of the reported studies can
be summarized as follows: 1. Interaction of intense
plasma-ion streams with SiC targets were investigated
in the PF-1000U and PF-360U facilities by means of the
OES technique; 2. The optical emission spectroscopy
enabled to determine dynamics of plasma and to
identify ion species of free plasma streams and plasma
produced at SiC targets surfaces; 3.
Quantitative analyses of the D-lines and estimations of
the electron concentration were possible in some cases
only, due to re-absorption effects; 4. In high-power PF-
1000U facility plasma produced at the SIC target
emitted distinct spectral lines ranging from Si I to Si IV
and from C II to C IV, while in the smaller PF-360U
facility there were recorder lines up to SI III and C III
only.5. Surface analyses of the virgin and irradiated SiC
samples showed considerable changes in the structure of
the surface layers.
Joint experiments performed by the NCBJ, IFPiLM,
KIPT and BIMMS teams, by means of different
facilities, has already enabled to collect some
information about intense plasma streams and erosion of
SiC-targets. Such studies should evidently be continued.
REFERENCES
1. M.J. Sadowski, M. Scholz // Plasma Sources Sci. &
Technol. 2008, v. 17, p. 024001.
2. V.A. Gribkov et al. // Phys. Scr. 2011, v. 83, 04560.
3. M.S. Ladygina et al. // Fusion Sci. Techol. 2011,
v. 60, p. 27.
4. E. Skladnik-Sadowska et al.// Phys. Scr. 2014,
v. T161014039.
5. M. Scholz et al. // Nukleonika. 2001, v. 46, p. 35-39
(in Russian).
6. R. Kwiatkowski et al.// Nukleonika. 2011, v. 56,
p. 119-123 (in Russian).
7. M.J. Sadowski et al.// PAST. Ser. „Plasma Phys”.
2013, № 1, p. 252-257.
Article received 18.09.2014
ИССЛЕДОВАНИЯ ВЗАИМОДЕЙСТВИЯ ИНТЕНСИВНЫХ ДЕЙТЕРИЕВЫХ ПЛАЗМЕННЫХ
ПОТОКОВ С SiC-МИШЕНЯМИ В ЭКСПЕРИМЕНТАХ НА ПЛАЗМА-ФОКУСЕ
E. Skladnik-Sadowska, R. Kwiatkowski, K. Malinowski, M.J. Sadowski, K. Czaus, D. Zaloga, J. Żebrowski,
K. Nowakowska-Langier, M. Kubkowska, M. Paduch, M. Scholz, E. Zielinska, М.С. Ладыгина, И.E. Гаркуша,
В.A. Грибков, E.В. Демина, С.A.Маслаев, В.Н. Пименов
Представлены результаты экспериментальных исследований по эмиссии видимого излучения из
интенсивных дейтериевых плазменных потоков свободно распространяющихся в вакуумной камере или
взаимодействующих с SiC-мишенями. Исследуемые импульсные плазменные потоки генерировались
высокоточными разрядами на двух установках типа плазменный фокус (ПФ). А именно, установка
PF-1000U, работающая в IFPiLM, и PF-360U, работающая в NCBJ. Детальные измерения были проведены с
использованием оптической эмиссионной спектроскопии (ОЭС). Параметры плазмы были оценены из D -
линии. Структурные изменения облучаемых SiC-образцов были проанализированы с помощью
сканирующего электронного микроскопа (СЭM) и энергии рентгеновского спектрометра (ЭРС).
ДОСЛІДЖЕННЯ ВЗАЄМОДІЇ ІНТЕНСИВНИХ ДЕЙТЕРІЄВИХ ПЛАЗМОВИХ ПОТОКІВ
З SiC-МІШЕНЯМИ В ЕКСПЕРИМЕНТАХ НА ПЛАЗМА-ФОКУСІ
E. Skladnik-Sadowska, R. Kwiatkowski, K. Malinowski, M.J. Sadowski, K. Czaus, D. Zaloga, J. Żebrowski,
K. Nowakowska-Langier, M. Kubkowska, M. Paduch, M. Scholz, E. Zielinska, M.С. Ладигіна, I.Є. Гаркуша,
В.О. Грібков, О.В. Деміна
4
, С.О. Маслаєв, В.М. Пимєнов
Представлено результати експериментальних досліджень з емісії видимого випромінювання з
інтенсивних дейтерієвих плазмових потоків, що вільно розповсюджуються у вакуумній камері чи
взаємодіють з SiC-мішенями. Імпульсні плазмові потоки, що досліджувались, генерувались високоточними
розрядами на двох установках типу плазмовий фокус (ПФ). А саме, установка PF-1000U, що функціонує в
IFPiLM, та PF-360U – у NCBJ. Детальні вимірювання були проведені за допомогою оптичної емісіонної
спектроскопії (OEС). Параметри плазми були оцінені з D -лінії. Структурні зміни опромінених SiC-мішеней
проаналізовані за допомогою скануючого електронного мікроскопа (СEM) та енергії рентгенівського
спектрометра (EРС).
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