Control complex for a double-sided microstrip detector production and tests

The controlling system for detector silicon and for a double-sided microstrip detectors (DSMD) characteristics tests is described.

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Published in:Вопросы атомной науки и техники
Date:2000
Main Authors: Kaplij, A.A., Kulibaba, V.I., Kuijer, P., Maslov, N.I., Ovchinnik, V.D., Potin, S.M., Starodubtsev, A.F.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2000
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/82268
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Control complex for a double-sided microstrip detector production and tests / A.A. Kaplij, V.I. Kulibaba, P. Kuijer, N.I. Maslov, V.D. Ovchinnik, S.M. Potin, A.F. Starodubtsev // Вопросы атомной науки и техники. — 2000. — № 2. — С. 41-45. — Бібліогр.: 5 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-82268
record_format dspace
spelling Kaplij, A.A.
Kulibaba, V.I.
Kuijer, P.
Maslov, N.I.
Ovchinnik, V.D.
Potin, S.M.
Starodubtsev, A.F.
2015-05-27T12:09:12Z
2015-05-27T12:09:12Z
2000
Control complex for a double-sided microstrip detector production and tests / A.A. Kaplij, V.I. Kulibaba, P. Kuijer, N.I. Maslov, V.D. Ovchinnik, S.M. Potin, A.F. Starodubtsev // Вопросы атомной науки и техники. — 2000. — № 2. — С. 41-45. — Бібліогр.: 5 назв. — англ.
1562-6016
PACS: 29.40.Wk
https://nasplib.isofts.kiev.ua/handle/123456789/82268
The controlling system for detector silicon and for a double-sided microstrip detectors (DSMD) characteristics tests is described.
en
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
Вопросы атомной науки и техники
Еxperimental methods
Control complex for a double-sided microstrip detector production and tests
Контролирующий комплекс для производства и испытаний двустороннего микрострипового детектора
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Control complex for a double-sided microstrip detector production and tests
spellingShingle Control complex for a double-sided microstrip detector production and tests
Kaplij, A.A.
Kulibaba, V.I.
Kuijer, P.
Maslov, N.I.
Ovchinnik, V.D.
Potin, S.M.
Starodubtsev, A.F.
Еxperimental methods
title_short Control complex for a double-sided microstrip detector production and tests
title_full Control complex for a double-sided microstrip detector production and tests
title_fullStr Control complex for a double-sided microstrip detector production and tests
title_full_unstemmed Control complex for a double-sided microstrip detector production and tests
title_sort control complex for a double-sided microstrip detector production and tests
author Kaplij, A.A.
Kulibaba, V.I.
Kuijer, P.
Maslov, N.I.
Ovchinnik, V.D.
Potin, S.M.
Starodubtsev, A.F.
author_facet Kaplij, A.A.
Kulibaba, V.I.
Kuijer, P.
Maslov, N.I.
Ovchinnik, V.D.
Potin, S.M.
Starodubtsev, A.F.
topic Еxperimental methods
topic_facet Еxperimental methods
publishDate 2000
language English
container_title Вопросы атомной науки и техники
publisher Національний науковий центр «Харківський фізико-технічний інститут» НАН України
format Article
title_alt Контролирующий комплекс для производства и испытаний двустороннего микрострипового детектора
description The controlling system for detector silicon and for a double-sided microstrip detectors (DSMD) characteristics tests is described.
issn 1562-6016
url https://nasplib.isofts.kiev.ua/handle/123456789/82268
fulltext
citation_txt Control complex for a double-sided microstrip detector production and tests / A.A. Kaplij, V.I. Kulibaba, P. Kuijer, N.I. Maslov, V.D. Ovchinnik, S.M. Potin, A.F. Starodubtsev // Вопросы атомной науки и техники. — 2000. — № 2. — С. 41-45. — Бібліогр.: 5 назв. — англ.
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first_indexed 2025-11-25T21:01:34Z
last_indexed 2025-11-25T21:01:34Z
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