Different Electron-Scattering Mechanisms’ Contribution to the Formation of the Amplitude Contrast of Electron-Microscopic Images
A new method of experimental determination of the amplitude contrast value of electron-microscopic images for amorphous materials is suggested. The mathematical relations for calculating the contributions of different mechanisms of electron scattering by the object under study to the contrast on the...
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| Veröffentlicht in: | Наносистеми, наноматеріали, нанотехнології |
|---|---|
| Datum: | 2015 |
| Hauptverfasser: | Bobyk, M.Yu., Ivanitsky, V.P., Ryaboshchuk, M.M., Svatyuk, O.Ya. |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут металофізики ім. Г.В. Курдюмова НАН України
2015
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/87980 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Different Electron-Scattering Mechanisms’ Contribution to the Formation of the Amplitude Contrast of Electron-Microscopic Images / M.Yu. Bobyk, V.P. Ivanitsky, M.M. Ryaboshchuk, O.Ya. Svatyuk // Наносистеми, наноматеріали, нанотехнології: Зб. наук. пр. — К.: РВВ ІМФ, 2015. — Т. 13, № 1. — С. 85–97. — Бібліогр.: 13 назв. — англ. |
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