Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions
Anomalous change of optical properties of recrystallized W caused by exposure to D plasma ions at sample
 temperature of ~535 K was studied by ellipsometry and reflectometry. There is a qualitative difference between the
 samples reflectivity values measured directly and calculated u...
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| Date: | 2011 |
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2011
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| Cite this: | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions / V.Kh. Alimov, A.I. Belyaeva, A.A. Galuza, K. Isobe, V.G. Konovalov, A.A. Savchenko, K.A. Slatin, S.I. Solodovchenko, V.S. Voitsenya, T. Yamanishi // Вопросы атомной науки и техники. — 2011. — № 1. — С. 179-181. — Бібліогр.: 13 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1860141395375816704 |
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| author | Alimov, V.Kh. Belyaeva, A.I. Galuza, A.A. Isobe, K. Konovalov, V.G. Savchenko, A.A. Slatin, K.A. Solodovchenko, S.I. Voitsenya, V.S. Yamanishi, T. |
| author_facet | Alimov, V.Kh. Belyaeva, A.I. Galuza, A.A. Isobe, K. Konovalov, V.G. Savchenko, A.A. Slatin, K.A. Solodovchenko, S.I. Voitsenya, V.S. Yamanishi, T. |
| citation_txt | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions / V.Kh. Alimov, A.I. Belyaeva, A.A. Galuza, K. Isobe, V.G. Konovalov, A.A. Savchenko, K.A. Slatin, S.I. Solodovchenko, V.S. Voitsenya, T. Yamanishi // Вопросы атомной науки и техники. — 2011. — № 1. — С. 179-181. — Бібліогр.: 13 назв. — англ. |
| collection | DSpace DC |
| container_title | Вопросы атомной науки и техники |
| description | Anomalous change of optical properties of recrystallized W caused by exposure to D plasma ions at sample
temperature of ~535 K was studied by ellipsometry and reflectometry. There is a qualitative difference between the
samples reflectivity values measured directly and calculated using ellipsometric data. A physical model of the
phenomenon is suggested. It is shown that on the W surface exposed at ~535 К two processes take place 1) blistering
and 2) modification of electron structure in the upper-most layer.
Методами еліпсометрії та рефлектометрії виявлено аномальне змінення оптичних властивостей
рекристалізованого W внаслідок бомбардування іонами D при температурі ~535 К. Існує принципова різниця
між значеннями коефіцієнту відбиття, що отримано рефлектометрією та розраховано за даними еліпсометрії.
Запропоновано фізичну модель виявленого ефекту. Показано, що на поверхні W, що опромінено при 535 К,
мають місце два процеси: 1) блістерінг и 2) модифікація електронної структури поверхневого шару.
Методами эллипсометрии и рефлектометрии обнаружено аномальное изменение оптических свойств
рекристаллизованного W в результате бомбардировки ионами D при температуре ~535 К. Имеет место
принципиальное отличие между значениями коэффициента отражения, измеренными рефлектометрией и
рассчитанными по данным эллипсометрии. Предложена физическая модель обнаруженного эффекта. Показано,
что на поверхности W, облученного при 535 К, имеют место два процесса: 1) блистеринг и 2) модификация
электронной структуры поверхностного слоя.
|
| first_indexed | 2025-12-07T17:49:42Z |
| format | Article |
| fulltext |
MODIFICATION OF OPTICAL PROPERTIES OF TUNGSTEN EXPOSED
TO LOW-ENERGY, HIGH FLUX DEUTERIUM PLASMA IONS
V.Kh. Alimov1, A.I. Belyaeva2, A.A. Galuza2, K. Isobe1, V.G. Konovalov3,
A.A. Savchenko2, K.A. Slatin2, S.I. Solodovchenko3, V.S. Voitsenya3, T. Yamanishi1
1Tritium Technology Group, Japan Atomic Energy Agency, Tokai, Ibaraki, Japan;
2National Technical University “Kharkov Polytechnical Institute”, Kharkov, Ukraine;
3Institute of Plasma Physics, NSC “Kharkov Institute of Physics and Technology”, Kharkov, Ukraine
E-mail: voitseny@kipt.kharkov.ua; belyaeva@kharkov.com
Anomalous change of optical properties of recrystallized W caused by exposure to D plasma ions at sample
temperature of ~535 K was studied by ellipsometry and reflectometry. There is a qualitative difference between the
samples reflectivity values measured directly and calculated using ellipsometric data. A physical model of the
phenomenon is suggested. It is shown that on the W surface exposed at ~535 К two processes take place 1) blistering
and 2) modification of electron structure in the upper-most layer.
PACS: 28.52.-s, 78.68.+m, 52.40.Hf, 68.47.De
1. INTRODUCTION
Due to its favorable physical properties, like low
erosion yield and high melting temperature, tungsten (W)
is foreseen as one of plasma-facing materials in fusion
reactors, such as ITER [1] and DEMO [2]. Moreover, W
is considered as a candidate for in-vessel mirror materials
for optical diagnostic systems in ITER [3]. As a plasma-
facing component, W mirrors will be subject to intense
fluxes of low-energy (energy is below the displacement
threshold) D and T particles including helium ash. This
implantation process leads to concerns about a change of
the optical properties after long-term hydrogen-helium
plasma exposure. The effect of irradiation with low-
energy H and He ions on the optical reflectivity of W
mirrors was investigated [4]; and the degree of the optical
reflectivity degradation was demonstrated to depend on
type of ions, irradiation temperature, ion energy, ion flux,
as well as on the properties of material itself.
PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. 2011. № 1. 179
Series: Plasma Physics (17), p. 179-181.
Blistering is one of phenomena influencing the optical
properties of W mirrors. There is evidence of blistering
occurred on tungsten surface exposed to hydrogen
plasmas with ion energies much below the displacement
threshold [5, 6].
Significant temperature dependence of surface
topography was found for re-crystallized W exposed to
low-energy (38 eV/D), high-flux (1022 D/m2s) D plasma
ions up to ion fluence 1026 D/m2 [6]. After plasma
exposure at temperatures, Texp, in the range from 320 to
400 K, only sparse blisters with diameters of 0.5…2 μm
are formed on the W surface. As the exposure temperature
increases, the blisters become much denser. Two kinds of
blisters appear after exposure at Texp = 520…570 K: large
low-dome blisters with sizes of 10…30 μm and small
cone-shaped blisters with diameters of less than a few
μm. No blisters appear at T > 700 K.
This work focuses on study of the temperature
dependence of the optical characteristics of recrystallized W
mirror exposed to the low-energy, high flux D plasma ions.
2. EXPERIMENTAL
Plates of polycrystalline tungsten (A.L.M.T. Corp.,
Japan), 10×10×2 mm3 in size, fully recrystallized in
hydrogen (protium) atmosphere at 2073 K after cutting
and polishing, with a purity of 99.99 wt%, were used as
W mirror samples. The linear plasma generator (JAEA,
Tokai, Japan) used for delivering plasma beam
comparable to the edge plasma in ITER divertor is
described elsewhere [7].
The samples numbers exposed at corresponding
temperature are shown in the Table for convenience.
Temperature of the samples while exposure
Sample # W42 W29 W30 W43 W35 W20
Texp, K 320 405 483 535 600 695
The optical measurements included: (i) direct measuring
a specular reflectance R at normal incidence of the light [8],
and (2) measuring the optical constants n and k by means of
ellipsometry [9]. In the second case, measurements of
ellipsometry parameters (Ψ and Δ) at different incidence
angle at fixed wavelength (633 nm) were used [10]. The
apparent reflectance at normal incidence, R, as calculated
from the ellipsometric data is a good measure of the real
normal-incidence reflectance. Surface pictures and the
surface relief parameters were obtained with the use of an
interferometric microscope [11].
3. RESULTS
3.1. MICROSCOPY AND INTERFEROMETRY
DATA
Optical microscopy of the samples irradiated at
different temperatures clearly shows distinctive feature of
the surface of the specimen W43 (535 K) (Fig. 1). An
interference image of clean (without blisters) parts of
sample surface consists of straight-line interference strips.
This firstly indicates that all samples maintained a
smooth surface, and secondly shows the lack of sputtering
which would lead to formation of a step structure [12].
The cone-shaped blisters in overwhelming majority
are of 1…5 μm in diameter (Fig. 1). The plane blisters are
significantly larger in size (7…12 µm).
180
Fig. 1. W43 interference picture (single arrows - small
blisters, double arrow - large ones). White arrow
indicates interference minimum stripe
3.2. ELLIPSOMETRIC AND REFLECTOMETRIC
DATA
The ellipsometric parameters Ψ and Δ were measured
for all exposed samples and the unexposed one – to know
the initial state of the mirror samples. To analyze the
samples surface various models were used and the bare
surface model turned out to be optimal. Fig. 2 shows
dependences of the samples optical constants n and k
calculated within this model on exposure temperature.
300 400 500 600 700
2,9
3,0
3,1
3,2
3,3
3,4
3,5
Exposure temperature T, K
n,
k
refractive index n
extinction coefficient k
Fig. 2. Optical constants n and k of recrystallized W
mirror as a function of the exposure temperature
300 400 500 600 700
40
45
50
55
60
65
R
ef
le
ct
an
ce
, %
Exposure temperature T, K
Ellipsometric data
Reflectometric data
Fig. 3. Normal incidence reflectance of recrystallized W
as a function of the exposure temperature (measured
directly and calculated from ellipsometric data)
One can see the optical constants “fall-out” for the W
exposed at Texp = 535 K: the refractive index n decreases
and the extinction coefficient k increases. Using these
indices, the reflection at normal incidence, R, was
calculated. In Fig. 3 these calculated R values are
compared with the values directly measured at the same
wavelength for normal incidence of light. Importantly to
pay attention on quantitative difference between R for
W43 specimen directly measured (fall down of R) and
found using ellipsometric data (rise of R).
4. DISCUSSION
Fig. 1 demonstrates that blistering is grain-dependent,
i.e., some grains are almost free from blisters but others
are almost fully covered with blisters. This is probably
connected with the fact that on the W surface the grains
with orientation (111) are most subjected to blistering in
comparison with grains of other orientations [5]. The
experimental conditions [5] were very similar to ours.
Thus, there is a probability that optical indices of the
smooth areas of this particular specimen can be in some
degree different from those characteristics for the W
surface with blisters.
Now we have to analyze the principal difference
between ellipsometrically estimated and directly
measured values of reflectance (see Fig. 3). It is worthy to
emphasize that ellipsometry and reflectometry are based
on different physical effects. Reflectometry of the
specular reflection measures the full energy specularly
reflected from the surface. Correspondingly, even small
defects of the surface result in increase of scattering and
corresponding decrease of specular reflection.
Ellipsometry is based on the study of changing the
polarization state of only specular component of the
probing radiation, and therefore brings information about
specularly reflecting parts of the surface.
The situation is possible when, with a developed
relief, a significant portion of the scattered light can also
get to the detector as the result of complex re-reflections
(Fig. 4, a). With that, the reflecting light is depolarized
and thus the full darkening (when null-method is used)
does not occur [13]. In our case during ellipsometry
measurement of the W43 specimen, practically total
blanking of reflected light took place what authenticates
the lack of depolarization and negligible contribution of
light scattered by defects (Fig. 4, b).
Fig. 4. Light scattering from surfaces with different
structures: a) specular reflection and depolarization;
b) specular reflection and scattering without
depolarization of specular component
The light scattered due to blistering results in decrease
of the specular reflection, thus leading to decrease of
reflectance measured by reflectometry (see Fig. 3).
181
The increase of reflectance found by ellipsometry
(see Fig. 3) indicates that the properties of the W43
specimen surface do change not only due to blistering but
also because of modification of the electronic structure of
those surface areas which are not affected by blistering;
the ellipsometry gave the optical indices for just these
parts of surface.
A small rise of reflectance (see Fig. 3) found by
ellipsometry can be connected with either increase of
extinction coefficient observed (see Fig. 2) or formation
of a quasifilm on the W43 surface. For better
interpretation of ellipsometric data, several models of
W43 surface were checked. It was ascertained that the
bare surface model is the optimal one. It means that the
thickness of the modified near-surface layer exceeds the
penetration depth of light or this layer has no sharp
boundary and thus cannot act as a film. Therefore, it was
concluded that an increase of R in Fig. 3 is due to
significant rise of the extinction coefficient seen in Fig. 2.
5. CONCLUSIONS
The optical properties of W mirror specimens exposed
to low-energy, high flux D plasma ions at various
temperatures were examined. The sharp change of
reflectance was found for the specimen exposed at 535 K
(W43).
Summarizing results obtained, we can conclude that
two processes are realized on the surface of the W43
specimen: (i) blistering and (ii) modification of the
electronic structure in the upper-most layer.
So, evidently ellipsometry and reflectometry
supplement each other effectively when such complicated
phenomenon as blistering occurs on the surface.
REFERENCES
1. G. Federici, P. Andrew, et al. Key ITER plasma edge
and plasmamaterial interaction issues// J. Nucl. Mater.
2003, v. 313-316, p. 11-22.
2. K. Tobita, S. Nishio, et al. Design Study of Fusion
DEMO Plant at JAERI // Fusion Eng. Des. 2006, v. 81,
p. 1151-1158.
3. A. Litnovsky, V.S. Voitsenya, et al. First mirrors for
diagnostic systems of ITER // Nucl. Fusion. 2007,
v. 47, p. 833-838.
4. M. Sakamoto, T. Miyazaki, et al. Surface modification
of tungsten mirrors due to low-energy helium plasma
irradiation in the compact PWI simulator APSEDAS //
Phys. Scr. 2009, v.T138, p. 014043.
5. W.M. Shu, A. Kawasuso, et al. Microstructure
dependence of deuterium retention and blistering in the
near-surface region of tungsten exposed to high flux
deuterium plasmas of 38 eV at 315 K // Phys. Scr.
2007, v. T128, p. 96-99.
6. V.Kh. Alimov, W.M. Shu, et al. Surface morphology and
deuterium retention in tungsten exposed to low-energy,
high flux pure and helium-seeded deuterium plasmas //
Phys. Scr. 2009, v. T138, p. 014048.
7. G.-N. Luo, W.M. Shu, et al. Ion species control in high
flux deuterium plasma beams produced by a linear
plasma generator // Rev. Sci. Instr. 2004, v. 75, p. 4374-
4378.
8. D.V. Orlinski, V.S. Voitsenya, et al. First mirrors for
diagnostic systems of an experimental fusion reactor //
Plasma Dev. Opers. 2007, v. 15, p. 33-75.
9. A.F. Bardamid, A.I. Belyaeva, et al. Optical properties
of Al mirrors under impact of deuterium plasma ions in
experiments simulating ITER conditions // J. Nucl.
Mater. 2009, v. 393, p. 473-480.
10. А.А. Galuza, A.D. Kudlenko, et al. A System for the
Automation of a Cryogenic Spectral Ellipsometer//
Instr. and Exp. Tech. 2003, v. 46, N 4, p. 477-479.
11. А.I. Belyaeva, А.А. Galuza, et al. Experimental
complex for microinterferometric investigations // Instr.
and Exp. Tech. 2008, N 6, p. 135-136.
12. A. Bardamid,V. Bryk, et al. Erosion of steel under
bombardment with ions of a deuterium plasma //
Vacuum. 2000, v. 58, p. 10-15.
13. I.S. Gainutdinov, E.A. Nesmelov, et al. On the theory
of the ellipsometry of an actual surface// J. Optical
Technol. 2008, v. 75, iss. 1, p. 41-43.
Article received 25.10.10.
МОДИФИКАЦИЯ ОПТИЧЕСКИХ СВОЙСТВ РЕКРИСТАЛЛИЗОВАННОГО ВОЛЬФРАМА,
ОБЛУЧЕННОГО НИЗКОЭНЕРГЕТИЧЕСКИМИ ИОНАМИ ДЕЙТЕРИЕВОЙ ПЛАЗМЫ
В.Х. Алимов, А.И. Беляева, A.A. Галуза, K. Isobe, В.Г. Коновалов, A.A. Савченко,
K.A. Слатин, С.И. Солодовченко, В.С. Войценя, T. Yamanishi
Методами эллипсометрии и рефлектометрии обнаружено аномальное изменение оптических свойств
рекристаллизованного W в результате бомбардировки ионами D при температуре ~535 К. Имеет место
принципиальное отличие между значениями коэффициента отражения, измеренными рефлектометрией и
рассчитанными по данным эллипсометрии. Предложена физическая модель обнаруженного эффекта. Показано,
что на поверхности W, облученного при 535 К, имеют место два процесса: 1) блистеринг и 2) модификация
электронной структуры поверхностного слоя.
МОДИФІКАЦІЯ ОПТИЧНИХ ВЛАСТИВОСТЕЙ ВОЛЬФРАМУ В НАСЛІДОК ОПРОМІНЕННЯ
ВЕЛИКИМ ПОТОКОМ НИЗЬКОЕНЕРГЕТИЧНИХ ИОНІВ ДЕЙТЕРІЄВОЇ ПЛАЗМИ
В.Х. Алімов, А.І. Беляєва, О.A. Галуза, K. Isobe, В.Г. Коновалов, A.О. Савченко,
K.О. Слатін, С.І. Солодовченко, В.С. Войценя, T. Yamanishi
Методами еліпсометрії та рефлектометрії виявлено аномальне змінення оптичних властивостей
рекристалізованого W внаслідок бомбардування іонами D при температурі ~535 К. Існує принципова різниця
між значеннями коефіцієнту відбиття, що отримано рефлектометрією та розраховано за даними еліпсометрії.
Запропоновано фізичну модель виявленого ефекту. Показано, що на поверхні W, що опромінено при 535 К,
мають місце два процеси: 1) блістерінг и 2) модифікація електронної структури поверхневого шару.
|
| id | nasplib_isofts_kiev_ua-123456789-91070 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1562-6016 |
| language | English |
| last_indexed | 2025-12-07T17:49:42Z |
| publishDate | 2011 |
| publisher | Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| record_format | dspace |
| spelling | Alimov, V.Kh. Belyaeva, A.I. Galuza, A.A. Isobe, K. Konovalov, V.G. Savchenko, A.A. Slatin, K.A. Solodovchenko, S.I. Voitsenya, V.S. Yamanishi, T. 2016-01-06T17:16:20Z 2016-01-06T17:16:20Z 2011 Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions / V.Kh. Alimov, A.I. Belyaeva, A.A. Galuza, K. Isobe, V.G. Konovalov, A.A. Savchenko, K.A. Slatin, S.I. Solodovchenko, V.S. Voitsenya, T. Yamanishi // Вопросы атомной науки и техники. — 2011. — № 1. — С. 179-181. — Бібліогр.: 13 назв. — англ. 1562-6016 PACS: 28.52.-s, 78.68.+m, 52.40.Hf, 68.47.De https://nasplib.isofts.kiev.ua/handle/123456789/91070 Anomalous change of optical properties of recrystallized W caused by exposure to D plasma ions at sample
 temperature of ~535 K was studied by ellipsometry and reflectometry. There is a qualitative difference between the
 samples reflectivity values measured directly and calculated using ellipsometric data. A physical model of the
 phenomenon is suggested. It is shown that on the W surface exposed at ~535 К two processes take place 1) blistering
 and 2) modification of electron structure in the upper-most layer. Методами еліпсометрії та рефлектометрії виявлено аномальне змінення оптичних властивостей
 рекристалізованого W внаслідок бомбардування іонами D при температурі ~535 К. Існує принципова різниця
 між значеннями коефіцієнту відбиття, що отримано рефлектометрією та розраховано за даними еліпсометрії.
 Запропоновано фізичну модель виявленого ефекту. Показано, що на поверхні W, що опромінено при 535 К,
 мають місце два процеси: 1) блістерінг и 2) модифікація електронної структури поверхневого шару. Методами эллипсометрии и рефлектометрии обнаружено аномальное изменение оптических свойств
 рекристаллизованного W в результате бомбардировки ионами D при температуре ~535 К. Имеет место
 принципиальное отличие между значениями коэффициента отражения, измеренными рефлектометрией и
 рассчитанными по данным эллипсометрии. Предложена физическая модель обнаруженного эффекта. Показано,
 что на поверхности W, облученного при 535 К, имеют место два процесса: 1) блистеринг и 2) модификация
 электронной структуры поверхностного слоя. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Диагностика плазмы Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions Модифікація оптичних властивостей вольфраму в наслідок опромінення великим потоком низькоенергетичних ионів дейтерієвої плазми Модификация оптических свойств рекристаллизованного вольфрама, облученного низкоэнергетическими ионами дейтериевой плазмы Article published earlier |
| spellingShingle | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions Alimov, V.Kh. Belyaeva, A.I. Galuza, A.A. Isobe, K. Konovalov, V.G. Savchenko, A.A. Slatin, K.A. Solodovchenko, S.I. Voitsenya, V.S. Yamanishi, T. Диагностика плазмы |
| title | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions |
| title_alt | Модифікація оптичних властивостей вольфраму в наслідок опромінення великим потоком низькоенергетичних ионів дейтерієвої плазми Модификация оптических свойств рекристаллизованного вольфрама, облученного низкоэнергетическими ионами дейтериевой плазмы |
| title_full | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions |
| title_fullStr | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions |
| title_full_unstemmed | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions |
| title_short | Modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions |
| title_sort | modification of optical properties of tungsten exposed to low-energy, high flux deuterium plasma ions |
| topic | Диагностика плазмы |
| topic_facet | Диагностика плазмы |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/91070 |
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