Investigation of the optical coatings on the dkdp single ctystals by x-ray photoelectron spectroscopy
Magnesium fluoride and tellurium oxide were used for fabrication of the protective and antireflective coatings on the DKDP crystals. The variation of the technology of coating deposition leads to changes of surface composition of coatings which was studied by using the X-ray photoelectron spectros...
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| Date: | 2004 |
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| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
Науковий фізико-технологічний центр МОН та НАН України
2004
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| Series: | Физическая инженерия поверхности |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/98494 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Investigation of the optical coatings on the dkdp single ctystals by x-ray photoelectron spectroscopy / V.Yu. Loya, A.V. Lada, P.P. Puga, V.T. Gritsyna // Физическая инженерия поверхности. — 2004. — Т. 2, № 4. — С. 220–223. — Бібліогр.: 4 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Summary: | Magnesium fluoride and tellurium oxide were used for fabrication of the protective and antireflective
coatings on the DKDP crystals. The variation of the technology of coating deposition leads to changes
of surface composition of coatings which was studied by using the X-ray photoelectron spectroscopy
(XPS). The XPS data allow us to conclude that carbon and its compounds, as well as oxygen resulting
in the oxide formation, are the main impurities introduced at the different stages of coating deposition.
The results of paper testify the fact that the ion beam processing of the DKDP single crystals with
film coatings deposited onto their working surfaces facilitates the recovery of the initial composition of
the film under deposition, the removal of impurities from the film surfaces that, in turn, contributes to
the improvement of mechanical properties of the coating and its consolidation. |
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