On analysis of the electromagnetic resistance of radioelectronic devices under impulse radiation
The results of investigations on degradation effects in the radioelectronics circuitry under the influence of the high-intensity pulse radiation are given. Analysis of the mechanism of degradation because of shortening the radio pulse radiation wavelength has been carried out. When the wavelength...
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| Date: | 2018 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2018
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| Series: | Вопросы атомной науки и техники |
| Subjects: | |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | On analysis of the electromagnetic resistance of radioelectronic devices under impulse radiation / Yu.Р. Loni, A.G. Ponomaryov, V.I. Chumakov // Вопросы атомной науки и техники. — 2018. — № 3. — С. 45-48. — Бібліогр.: 19 назв. — англ. |