On analysis of the electromagnetic resistance of radioelectronic devices under impulse radiation

The results of investigations on degradation effects in the radioelectronics circuitry under the influence of the high-intensity pulse radiation are given. Analysis of the mechanism of degradation because of shortening the radio pulse radiation wavelength has been carried out. When the wavelength...

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Bibliographic Details
Date:2018
Main Authors: Lonin, Yu.Р., Ponomaryov, A.G., Chumakov, V.I.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2018
Series:Вопросы атомной науки и техники
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:On analysis of the electromagnetic resistance of radioelectronic devices under impulse radiation / Yu.Р. Loni, A.G. Ponomaryov, V.I. Chumakov // Вопросы атомной науки и техники. — 2018. — № 3. — С. 45-48. — Бібліогр.: 19 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine