Вплив пружних деформацій на локальні характеристики струму окремих нанокластерів Ge на Si, досліджених методом провідної атомно-силової мікроскопії
Local current characteristics of epitaxial systems with Ge nanoislands on Si (001) were investigated using conducting atomic force microscopy (AFM). The distribution of local currents inside Ge quantum dots showed a good correspondence with the values of internal deformations that determine the maxi...
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| Date: | 2012 |
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| Main Author: | |
| Format: | Article |
| Language: | Russian |
| Published: |
Chuiko Institute of Surface Chemistry National Academy of Sciences of Ukraine
2012
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| Online Access: | https://surfacezbir.com.ua/index.php/surface/article/view/485 |
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| Journal Title: | Surface |
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