Визначення профілів розподілу елементів по глибині приповерхневого шару тонких плівок Ge33As12Se55
Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectros...
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| Date: | 2010 |
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| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
Chuiko Institute of Surface Chemistry National Academy of Sciences of Ukraine
2010
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| Online Access: | https://www.cpts.com.ua/index.php/cpts/article/view/50 |
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| Journal Title: | Chemistry, Physics and Technology of Surface |