Рентгенофотоелектронна і ОЖЕ-спектроскопія в дослідженнях поверхні твердого тіла

• Дата: 2016
• Автори: Terebinska, M. I., Tkachuk, O. I., Lobanov, V. V.
• Формат: Стаття
• Мова: Російська
• Опубліковано: Chuiko Institute of Surface Chemistry National Academy of Sciences of Ukraine 2016
• Онлайн доступ: https://surfacezbir.com.ua/index.php/surface/article/view/603
• Назва журналу: Surface

The paper describes the physical principles of X-ray photoelectron and ultraviolet spectroscopy and Auger electron spectroscopy. We consider the distribution of the kinetic energy of the electrons formed as a result of the external photoelectric effect, and electrons leaves the atom with the relaxation of the initial state of its core-shell. We discuss the phenomena that determine the shape, the fine structure and the intensity of the spectral lines. Analyzed in detail the possibility of qualitative and quantitative analysis of the atomic composition, "false line", the chemical shifts of the lines of the core levels of atoms in different chemical environments. Analysis of these lines allows the chemical composition of the solid surface and near-surface region. Proper attention is paid to quantum-chemical methods of finding the energy levels of core states and density of states of the valence-electron levels and approaches developed to compare the experimentally obtained spectra of X-ray photoelectron and ultraviolet spectroscopy and Auger electron spectroscopy and theoretical calculations.