Морфологія та оптичні константи нанокристалічних плівок Gе на поверхні Sі(001)
The Ge and SiGe nanocrystalline films were grown on Si(001) surface by molecular-beam epitaxy. The optical constants of thin films were determined by multy-angle monochromatic ellipsometry. Optical properties of such systems were described using the Bruggeman's theory of effective medium approx...
Збережено в:
| Дата: | 2016 |
|---|---|
| Автори та афіліації: |
|
| Ключові слова: | keywords |
| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | Українська |
| Опубліковано: |
Chuiko Institute of Surface Chemistry National Academy of Sciences of Ukraine
2016
|
| Онлайн доступ: | https://surfacezbir.com.ua/index.php/surface/article/view/620 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Surface |
| Завантажити файл: |
|
Репозитарії
Surface| Резюме: | The Ge and SiGe nanocrystalline films were grown on Si(001) surface by molecular-beam epitaxy. The optical constants of thin films were determined by multy-angle monochromatic ellipsometry. Optical properties of such systems were described using the Bruggeman's theory of effective medium approximation. Deposition of Si on the surface with Ge nanoclusters changes the effective optical constants due to porosity of the nanocrystalline films. |
|---|---|
| DOI: | 10.15407/Surface.2016.08.218 |