ВИКОРИСТАННЯ РЕНТГЕНІВСЬКОЇ ТОПОГРАФІЇ ДЛЯ ДОСЛІДЖЕННЯ РЕАЛЬНОЇ СТРУКТУРИ НРНТ-МОНОКРИСТАЛІВ АЛМАЗУ ТИПУ ІІа
Features of the internal structure were studied using X-ray topography and the method of selective etching. Sectional topograms of the crystal were obtained - the original image and its appearance in reverse contrast. The obtained topogram pictures demonstrate the physical faces of the crystal, grow...
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| Date: | 2024 |
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| Main Authors: | , , , , , , |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
Институт сверхтвердых материалов им. В. Н. Бакуля Национальной академии наук Украины
2024
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| Subjects: | |
| Online Access: | http://altis-ism.org.ua/index.php/ALTIS/article/view/348 |
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| Journal Title: | Tooling materials science |