Subpixel Detection of Spectrum Images by Photodiode Structures

• Main Authors: Yegorov, A. D., Yegorov, V. A., Yegorov, S. A.
• Format: Article
• Language: rus
• Published: Видавничий дім «Академперіодика» 2012
• Online Access: http://rpra-journal.org.ua/index.php/ra/article/view/534

The present paper is devoted to the issues of enhancing the photometer’s resolving power when the spectrum images are detected by linear image sensors on emission spectrometers. Here we focus our attention on the case where the size of a photodiode structure pixel exceeds the width of the point-spread function of an optical device. It is shown that a combination of the parallel detection of all points of an image with its successive shift relative to a recording structure ensures proper recording of thus obtained image, hence the optical section of the device with an arbitrarily large sensor pixel having no loss of resolution. The problem pertaining to measurement data handling reduces to finding a solution to the inconsistent set of linear equations. An algorithm is suggested for solving the derived system of equations. The results illustrating the operation of this particular algorithm are herewith shown.