Исследование воспроизводимости электрофизических параметров толстопленочных структур "RuO2-стекло"
The dependence of the electrophysical parameters of RuO2–glass thick-film resistive structures on component dispersion and firing temperature has been investigated. It has been shown that the resistance of the layers can be varied by changing the particle size of the initial components. The use of...
Збережено в:
| Дата: | 2005 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | Українська |
| Опубліковано: |
PE "Politekhperiodika", Book and Journal Publishers
2005
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| Теми: | |
| Онлайн доступ: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2005.4.62 |
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| Назва журналу: | Technology and design in electronic equipment |
Репозитарії
Technology and design in electronic equipment| Резюме: | The dependence of the electrophysical parameters of RuO2–glass thick-film resistive structures on component dispersion and firing temperature has been investigated. It has been shown that the resistance of the layers can be varied by changing the particle size of the initial components. The use of homogeneous powders of the starting materials increases the adhesion strength of the film to the substrate.
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