Микронегатронный преобразователь давления на основе кремниевой МОП-структуры
The influence of local anisotropic pressure on a silicon MOS structure has been investigated. It is shown that the increase in inversion capacitance is associated not only with the growth of positive carriers in the oxide at the Si–SiO interface under the influence of local pressure, but also with t...
Saved in:
| Date: | 2004 |
|---|---|
| Main Authors: | , , |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2004
|
| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.5.29 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Technology and design in electronic equipment |