Вимірювальна система для тестування електричних параметрів ПЗЗЕМ різного формату

Вимірювальна система для тестування електричних параметрів ПЗЗЕМ різного формату

This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents...

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Bibliographic Details
Date:2019
Main Authors: Zabudsky, Viacheslav, Golenkov, Oleksandr, Rikhalsky, Oleg, Reva, Vladimir, Korinets , Sergij, Dukhnin, Sergey
Format: Article
Language:English
Published: PE "Politekhperiodika", Book and Journal Publishers 2019
Subjects:
фотодетектори
прилади з зарядовим зв’язком з електронним множенням
вимірювальна система
фотоелектричні параметри
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2019.5-6.03
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment
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Summary:This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents, output amplifier sensitivity, charge transfer efficiency, charge capacity and other parameters. The studies were conducted, both on the wafer and in the body, on samples of the following formats: 576×288, 640×512, 768×576, 1024×1024, and 1280×1024.

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