Вимірювальна система для тестування електричних параметрів ПЗЗЕМ різного формату
This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents...
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| Date: | 2019 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2019
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| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2019.5-6.03 |
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| Journal Title: | Technology and design in electronic equipment |