Контактообразующие пленки боридов и нитридов титана в арсенидгаллиевых СВЧ-приборах

The thermal stability of ohmic and rectifying contact systems AuGe—Ta—Au, AuGe—TaNₓ—Au, AuGe—TiBₓ—Au, AuGe—TiBₓ—Mo—Au, and Ti—Au, TiNₓ—Au, TiBₓ—Au to n-type gallium arsenide epitaxial structures with a thickness of 3–5 μm and a carrier concentration of (5...6)·1015 cm–3 is considered. I...

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Published in:Технологія та конструювання в електронній апаратурі
Date:2002
Issue:6
Pages:54-56
ISSN:3083-6549
Author Affiliations:
  • V. N. Ivanov — Research Institute «Orion», Kyiv, Ukraine
  • R. V. Konakova — V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • V. V. Milenin — V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • M. A. Stovpovoi — Research Institute «Orion», Kyiv, Ukraine
Main Authors: Ivanov, V. N., Konakova, R. V., Milenin, V. V., Stovpovoi, M. A.
Format: Article
Language:Vietnamese
Published: PE "Politekhperiodika", Book and Journal Publishers 2002
Subjects:
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2002.6.54
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Journal Title:Technology and design in electronic equipment
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