Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe
The article is devoted to studying of influence of vacuum low-temperature annealing on the electrical and photoelectric characteristics of n-ZnO-p-InSe heterostructure.Indium monoselenide (InSe) is a semiconductor of the A3B6 group of layered compounds. The basic unit consists of two planes...
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2015
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oai:tkea.com.ua:article-2652025-05-30T19:32:05Z Annealing effect on I-V characteristic of n-ZnO – p-InSe heterojunction Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe Kovalyuk, Z. D. Katerynchuk, V. M. Kudrynskyi, Z. R. Kushnir, B. V. Netyaga, V. V. Khomyak, V. V. indium selenide ZnO thin film heterojunction CVC spectral photosensitivity селенид индия оксид цинка тонкая пленка гетеропереход ВАХ спектральная фоточувствительность The article is devoted to studying of influence of vacuum low-temperature annealing on the electrical and photoelectric characteristics of n-ZnO-p-InSe heterostructure.Indium monoselenide (InSe) is a semiconductor of the A3B6 group of layered compounds. The basic unit consists of two planes of metal atoms sandwiched between two planes of chalcogen atoms (Se-In-In-Se). The absence of dangling bonds on InSe cleaved surface makes it possible to use this semiconductor as a substrate for fabrication of heterostructures based on semiconductor materials with different symmetries and lattice spacings. Zinc oxide (ZnO) is the most suitable material for window materials and solar cells buffer layers application due to its marvelous transparency in the range of visible region.InSe single crystals were grown by the Bridgman technique from a nonstoichiometric melt and characterized by a pronounced layered structure along the whole length of a sample. ZnO thin oxide film was formed on freshly cleaved van der Waals surface of InSe layered crystal. n-ZnO-p-InSe heterostructure was prepared by the method of high-frequency magnetron sputtering. Sensitivity spectral areas were identified by MDR-3 monochromator with a resolution of 2.6 nm/mm.The current-voltage characteristics of the n-ZnO-p-InSe heterostructures showed a clearly pronounced diode character. In the forward bias of the initial samples, the diode factor had the value 3.7 at room temperature. It is shown that vacuum low-temperature annealing reduces shunt currents of the heterojunction, which is reflected in the decrease in the values of n from 3.7 to 2.7. Методом высокочастотного магнетронного напыления сформирована тонкая оксидная пленка ZnO на ван-дер-ваальсовой поверхности моноселенида индия. Исследовано влияние вакуумного низкотемпературного отжига на электрические и фотоэлектрические характеристики гетероперехода n-ZnO — p-InSe. Приведены температурные зависимости ВАХ гетероперехода до и после отжига. Установлена область спектральной фоточувствительности гетероструктуры n-ZnO—p-InSe. PE "Politekhperiodika", Book and Journal Publishers 2015-12-25 Article Article Peer-reviewed Article application/pdf https://www.tkea.com.ua/index.php/journal/article/view/TKEA2015.5-6.50 10.15222/TKEA2015.5-6.50 Technology and design in electronic equipment; No. 5–6 (2015): Tekhnologiya i konstruirovanie v elektronnoi apparature; 50-54 Технологія та конструювання в електронній апаратурі; № 5–6 (2015): Технология и конструирование в электронной аппаратуре; 50-54 3083-6549 3083-6530 uk https://www.tkea.com.ua/index.php/journal/article/view/TKEA2015.5-6.50/233 Copyright (c) 2015 Kovalyuk Z. D., Katerynchuk V. M., Kudrynskyi Z. R., Kushnir B. V., Netyaga V. V., Khomyak V. V. http://creativecommons.org/licenses/by/4.0/ |
| institution |
Technology and design in electronic equipment |
| baseUrl_str |
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| datestamp_date |
2025-05-30T19:32:05Z |
| collection |
OJS |
| language |
Ukrainian |
| topic |
селенид индия оксид цинка тонкая пленка гетеропереход ВАХ спектральная фоточувствительность |
| spellingShingle |
селенид индия оксид цинка тонкая пленка гетеропереход ВАХ спектральная фоточувствительность Kovalyuk, Z. D. Katerynchuk, V. M. Kudrynskyi, Z. R. Kushnir, B. V. Netyaga, V. V. Khomyak, V. V. Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe |
| topic_facet |
indium selenide ZnO thin film heterojunction CVC spectral photosensitivity селенид индия оксид цинка тонкая пленка гетеропереход ВАХ спектральная фоточувствительность |
| format |
Article |
| author |
Kovalyuk, Z. D. Katerynchuk, V. M. Kudrynskyi, Z. R. Kushnir, B. V. Netyaga, V. V. Khomyak, V. V. |
| author_facet |
Kovalyuk, Z. D. Katerynchuk, V. M. Kudrynskyi, Z. R. Kushnir, B. V. Netyaga, V. V. Khomyak, V. V. |
| author_sort |
Kovalyuk, Z. D. |
| title |
Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe |
| title_short |
Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe |
| title_full |
Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe |
| title_fullStr |
Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe |
| title_full_unstemmed |
Влияние отжига на ВАХ гетероперехода n-ZnO – p-InSe |
| title_sort |
влияние отжига на вах гетероперехода n-zno – p-inse |
| title_alt |
Annealing effect on I-V characteristic of n-ZnO – p-InSe heterojunction |
| description |
The article is devoted to studying of influence of vacuum low-temperature annealing on the electrical and photoelectric characteristics of n-ZnO-p-InSe heterostructure.Indium monoselenide (InSe) is a semiconductor of the A3B6 group of layered compounds. The basic unit consists of two planes of metal atoms sandwiched between two planes of chalcogen atoms (Se-In-In-Se). The absence of dangling bonds on InSe cleaved surface makes it possible to use this semiconductor as a substrate for fabrication of heterostructures based on semiconductor materials with different symmetries and lattice spacings. Zinc oxide (ZnO) is the most suitable material for window materials and solar cells buffer layers application due to its marvelous transparency in the range of visible region.InSe single crystals were grown by the Bridgman technique from a nonstoichiometric melt and characterized by a pronounced layered structure along the whole length of a sample. ZnO thin oxide film was formed on freshly cleaved van der Waals surface of InSe layered crystal. n-ZnO-p-InSe heterostructure was prepared by the method of high-frequency magnetron sputtering. Sensitivity spectral areas were identified by MDR-3 monochromator with a resolution of 2.6 nm/mm.The current-voltage characteristics of the n-ZnO-p-InSe heterostructures showed a clearly pronounced diode character. In the forward bias of the initial samples, the diode factor had the value 3.7 at room temperature. It is shown that vacuum low-temperature annealing reduces shunt currents of the heterojunction, which is reflected in the decrease in the values of n from 3.7 to 2.7. |
| publisher |
PE "Politekhperiodika", Book and Journal Publishers |
| publishDate |
2015 |
| url |
https://www.tkea.com.ua/index.php/journal/article/view/TKEA2015.5-6.50 |
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2025-09-24T17:30:38Z |
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2025-09-24T17:30:38Z |
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