Исследование метрологических характеристик системы измерения малых изменений температуры
Metrological parameters of the non-standard contact device were investigated to characterize its performance in temperature change measurements in the specified temperature range. Several series thermistors with a negative temperature coefficient of resistance connected into a linearization circuit...
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| Datum: | 2014 |
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| Format: | Artikel |
| Sprache: | Ukrainian |
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PE "Politekhperiodika", Book and Journal Publishers
2014
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| Назва журналу: | Technology and design in electronic equipment |
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oai:tkea.com.ua:article-3352025-05-30T19:34:43Z Investigation of metrological parameters of measuring system for small temperature changes Исследование метрологических характеристик системы измерения малых изменений температуры Samynina, M. G. Shigimaga, V. A. temperature change measuring semiconductor thermoresistors resolution metrological parameters измерение изменения температуры полупроводниковые терморезисторы разрешающая способность метрологические параметры Metrological parameters of the non-standard contact device were investigated to characterize its performance in temperature change measurements in the specified temperature range. Several series thermistors with a negative temperature coefficient of resistance connected into a linearization circuit were used as the sensing element of the semiconductor device. Increasing the number of thermistors leads to improved circuitry resolving power and reduced dispersion of this parameter. However, there is the question of optimal ratio of the number of thermistors and implemented temperature resolution, due to the nonlinear resolution dependence of the number of series-connected thermoelements. An example of the scheme of four similar thermistors as the primary sensor and of a standard measuring instrument, which is working in ohmmeter mode, shows the ability to measure temperature changes at the level of hundredth of a Celsius degree. In this case, a quantization error, which is determined by a resolution of the measuring system, and the ohmmeter accuracy make the main contribution to the overall accuracy of measuring small temperature changes. Предложено нестандартное устройство на основе полупроводниковых терморезисторов с отрицательным температурным коэффициентом сопротивления для контактного измерения изменений температуры в установленном диапазоне. Показано влияние количества последовательно включенных термоэлементов на параметры измерительной системы, исследованы ее метрологические характеристики. PE "Politekhperiodika", Book and Journal Publishers 2014-02-25 Article Article Peer-reviewed Article application/pdf https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.1.52 10.15222/TKEA2014.1.52 Technology and design in electronic equipment; No. 1 (2014): Tekhnologiya i konstruirovanie v elektronnoi apparature; 52-56 Технологія та конструювання в електронній апаратурі; № 1 (2014): Технология и конструирование в электронной аппаратуре; 52-56 3083-6549 3083-6530 uk https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.1.52/299 Copyright (c) 2014 Samynina M. G., Shigimaga V. A. http://creativecommons.org/licenses/by/4.0/ |
| institution |
Technology and design in electronic equipment |
| baseUrl_str |
|
| datestamp_date |
2025-05-30T19:34:43Z |
| collection |
OJS |
| language |
Ukrainian |
| topic |
измерение изменения температуры полупроводниковые терморезисторы разрешающая способность метрологические параметры |
| spellingShingle |
измерение изменения температуры полупроводниковые терморезисторы разрешающая способность метрологические параметры Samynina, M. G. Shigimaga, V. A. Исследование метрологических характеристик системы измерения малых изменений температуры |
| topic_facet |
temperature change measuring semiconductor thermoresistors resolution metrological parameters измерение изменения температуры полупроводниковые терморезисторы разрешающая способность метрологические параметры |
| format |
Article |
| author |
Samynina, M. G. Shigimaga, V. A. |
| author_facet |
Samynina, M. G. Shigimaga, V. A. |
| author_sort |
Samynina, M. G. |
| title |
Исследование метрологических характеристик системы измерения малых изменений температуры |
| title_short |
Исследование метрологических характеристик системы измерения малых изменений температуры |
| title_full |
Исследование метрологических характеристик системы измерения малых изменений температуры |
| title_fullStr |
Исследование метрологических характеристик системы измерения малых изменений температуры |
| title_full_unstemmed |
Исследование метрологических характеристик системы измерения малых изменений температуры |
| title_sort |
исследование метрологических характеристик системы измерения малых изменений температуры |
| title_alt |
Investigation of metrological parameters of measuring system for small temperature changes |
| description |
Metrological parameters of the non-standard contact device were investigated to characterize its performance in temperature change measurements in the specified temperature range. Several series thermistors with a negative temperature coefficient of resistance connected into a linearization circuit were used as the sensing element of the semiconductor device. Increasing the number of thermistors leads to improved circuitry resolving power and reduced dispersion of this parameter. However, there is the question of optimal ratio of the number of thermistors and implemented temperature resolution, due to the nonlinear resolution dependence of the number of series-connected thermoelements. An example of the scheme of four similar thermistors as the primary sensor and of a standard measuring instrument, which is working in ohmmeter mode, shows the ability to measure temperature changes at the level of hundredth of a Celsius degree. In this case, a quantization error, which is determined by a resolution of the measuring system, and the ohmmeter accuracy make the main contribution to the overall accuracy of measuring small temperature changes. |
| publisher |
PE "Politekhperiodika", Book and Journal Publishers |
| publishDate |
2014 |
| url |
https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.1.52 |
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AT samyninamg investigationofmetrologicalparametersofmeasuringsystemforsmalltemperaturechanges AT shigimagava investigationofmetrologicalparametersofmeasuringsystemforsmalltemperaturechanges AT samyninamg issledovaniemetrologičeskihharakteristiksistemyizmereniâmalyhizmenenijtemperatury AT shigimagava issledovaniemetrologičeskihharakteristiksistemyizmereniâmalyhizmenenijtemperatury |
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2025-09-24T17:30:46Z |
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2025-09-24T17:30:46Z |
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