Повышение надежности диодов Шоттки при воздействии разрядов cтатического элек­три­чес­тва

Повышение надежности диодов Шоттки при воздействии разрядов cтатического элек­три­чес­тва

Experimental studies of Schottky diodes with molybdenum barrier structure showed that resistance of the structures to electrostatic discharge depends on the design parameters, as well as on guard ring diffusion depth. It has been proven that to improve the reliability of Schottky diodes one should u...

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Bibliographic Details
Date:2012
Main Authors: Sоlоdukha, V. A., Turtsevich, A. S., Solov’yov, J. A., Rubtsevich, I. I., Kerentsev, A. F.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2012
Subjects:
диод Шоттки
потенциальный барьер
разряд статического электричества
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.22
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment

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https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.22

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