Метод оценки качества тонкопленочной платы
A method for estimation of the quality of a thin-film board has been developed, based on the results of resistance measuring and instrumental errors calculation. Recommendations are given for the exclusion of gross errors in the application of the method. The practical estimation carried out shows t...
Gespeichert in:
| Datum: | 2012 |
|---|---|
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | Ukrainian |
| Veröffentlicht: |
PE "Politekhperiodika", Book and Journal Publishers
2012
|
| Schlagworte: | |
| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.3.31 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Technology and design in electronic equipment |
Institution
Technology and design in electronic equipment| Zusammenfassung: | A method for estimation of the quality of a thin-film board has been developed, based on the results of resistance measuring and instrumental errors calculation. Recommendations are given for the exclusion of gross errors in the application of the method. The practical estimation carried out shows the high efficiency of the developed algorithms. This method allows increasing the boards yield by 1,5–2 times. |
|---|