Исследование свойств пленок нитрида и оксида кремния, полученных методом пла­з­мо­хи­ми­чес­кого осаждения на кремниевую подложку

The research has been carried out on dependence of mechanical stress on the modes of deposition of silicon nitride and oxide films obtained by plasma excited chemical vapour deposition of the layers from the gas phase (PECVD). The connection has been determined between the key parameters of the depo...

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Bibliographic Details
Date:2011
Main Authors: Rubtsevich, I. I., Solovyov, Ya. A., Vysotskiy, V. B., Dudkin, A. I., Kovalchuk, N. S.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2011
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Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.4.29
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment

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