Исследование свойств пленок нитрида и оксида кремния, полученных методом пла­з­мо­хи­ми­чес­кого осаждения на кремниевую подложку

The research has been carried out on dependence of mechanical stress on the modes of deposition of silicon nitride and oxide films obtained by plasma excited chemical vapour deposition of the layers from the gas phase (PECVD). The connection has been determined between the key parameters of the depo...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Datum:2011
Hauptverfasser: Rubtsevich, I. I., Solovyov, Ya. A., Vysotskiy, V. B., Dudkin, A. I., Kovalchuk, N. S.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2011
Schlagworte:
Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.4.29
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Technology and design in electronic equipment

Institution

Technology and design in electronic equipment