Свойства металлических контактов на пленках TiO2, изготовленных методом реактивного магнетронного распыления

The properties of recrystallized polysilicon on insulator layers of p-type conductive SOI-structures with different carrier concentration irradiated with high-energy electrons flow about 1017 сm–2 in temperature range 4,2–300 К and high magnetic fields were investigated. It was found that h...

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Bibliographische Detailangaben
Datum:2010
1. Verfasser: Khoverko, Yu. N.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2010
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Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2010.5-6.63
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Назва журналу:Technology and design in electronic equipment

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Technology and design in electronic equipment