Арсенид-галлиевые p+–n–p+-структуры с обедняемой базовой областью

The work experimentally demonstrates that the mechanism of current transport through p+GaAs–nGaAs–p+GaAs structure is determined by injection–tunneling and generation–recombination mechanisms. When modulating the part of the base containing defects, the injection–tunneling current predominates, whil...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Datum:2009
Hauptverfasser: Karimov, A. V., Yodgorova, D. M., Abdulkhaev, O. A.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2009
Schlagworte:
Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2009.3.28
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Technology and design in electronic equipment

Institution

Technology and design in electronic equipment