Cвязь параметров спектральной плотности фликкер-шума с особенностями внутренней структуры системы
The results of computer modeling of the chaotic motion of elementary particles in a flat rectangle, which can be correlated with a thin-film resistor containing conduction electrons, are presented. Analysis of the spectral density of the chaotic motion shows that one of the parameters of flicker no...
Збережено в:
| Дата: | 2009 |
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| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | Ukrainian |
| Опубліковано: |
PE "Politekhperiodika", Book and Journal Publishers
2009
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| Теми: | |
| Онлайн доступ: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2009.1.10 |
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| Назва журналу: | Technology and design in electronic equipment |
Репозитарії
Technology and design in electronic equipment| Резюме: | The results of computer modeling of the chaotic motion of elementary particles in a flat rectangle, which can be correlated with a thin-film resistor containing conduction electrons, are presented. Analysis of the spectral density of the chaotic motion shows that one of the parameters of flicker noise depends only on the number of elementary particles and the average velocity of their motion. The second parameter of flicker noise (relaxation time) depends on the features of the internal structure of the system. This can be used to predict the reliability of both individual electronic components and equipment as a whole based on the measured level of their flicker noise.
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