Cвязь параметров спектральной плотности фликкер-шума с особенностями внутренней структуры системы
The results of computer modeling of the chaotic motion of elementary particles in a flat rectangle, which can be correlated with a thin-film resistor containing conduction electrons, are presented. Analysis of the spectral density of the chaotic motion shows that one of the parameters of flicker no...
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| Datum: | 2009 |
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| Hauptverfasser: | , , , , , |
| Format: | Artikel |
| Sprache: | Ukrainian |
| Veröffentlicht: |
PE "Politekhperiodika", Book and Journal Publishers
2009
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| Schlagworte: | |
| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2009.1.10 |
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| Назва журналу: | Technology and design in electronic equipment |