Cover Image

Усовершенствованный метод выявления «горячих точек» в изделиях микроэлектроники

A new method of liquid‑crystal thermography for detecting “hot spots” in microelectronic device crystals has been developed. The method is based on the visual display of a “hot spot” by the local cholesteric phase within the transparent smectic phase of a cholesteric liquid crystal, against the clea...

Full description

Saved in:
Bibliographic Details
Date:2008
Main Authors: Popov, V. M., Klimenko, A. S., Pokanevich, A. P.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2008
Subjects:
«горячая точка»
визуализация
дефекты
нематические и холестерические жидкие кристаллы
жидкокристаллические фазы
интегральные схемы
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.3.55
Tags: Add Tag
No Tags, Be the first to tag this record!
Journal Title:Technology and design in electronic equipment

Institution

Technology and design in electronic equipment
Description
Summary:A new method of liquid‑crystal thermography for detecting “hot spots” in microelectronic device crystals has been developed. The method is based on the visual display of a “hot spot” by the local cholesteric phase within the transparent smectic phase of a cholesteric liquid crystal, against the clear background of the topological elements of the device crystal surface. Examples of “hot spot” visualization on samples of crystals of various types of integrated circuits are presented.

Similar Items