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Усовершенствованный метод выявления «горячих точек» в изделиях микроэлектроники

A new method of liquid‑crystal thermography for detecting “hot spots” in microelectronic device crystals has been developed. The method is based on the visual display of a “hot spot” by the local cholesteric phase within the transparent smectic phase of a cholesteric liquid crystal, against the clea...

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Bibliographic Details
Date:2008
Main Authors: Popov, V. M., Klimenko, A. S., Pokanevich, A. P.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2008
Subjects:
«горячая точка»
визуализация
дефекты
нематические и холестерические жидкие кристаллы
жидкокристаллические фазы
интегральные схемы
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.3.55
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment

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https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.3.55

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