Изменение сопротивления силовых диодов под действием импульсов ударного тока
The causes of failure of semiconductor power diodes under the action of surge current pulses have been investigated. It is shown that currents below the surge level do not affect the diode resistance or reliability. When the current reaches the surge value, the diode resistance increases after each...
Збережено в:
| Дата: | 2007 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | Українська |
| Опубліковано: |
PE "Politekhperiodika", Book and Journal Publishers
2007
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| Теми: | |
| Онлайн доступ: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2007.6.33 |
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| Назва журналу: | Technology and design in electronic equipment |
Репозитарії
Technology and design in electronic equipment| Резюме: | The causes of failure of semiconductor power diodes under the action of surge current pulses have been investigated. It is shown that currents below the surge level do not affect the diode resistance or reliability. When the current reaches the surge value, the diode resistance increases after each repeated pulse, and after several pulses the diode fails. In this case, the forward resistance increases approximately threefold, while the temperature significantly exceeds the permissible limit. An explanation of the observed effects is proposed.
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