Свойства эпитаксиальных слоев GaAs, легированных редкоземельными элементами

An analysis has been carried out of the properties of epitaxial GaAs layers obtained from gallium melts doped with rare‑earth elements (REEs). It has been established that each REE corresponds to a certain critical concentration in the melt, above which an inversion of the conductivity type of the e...

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Bibliographic Details
Date:2007
Main Authors: Krukovsky, S. I., Suvorotka, N. Ya.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2007
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Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2007.2.47
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment