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Устройство для бесконтактного измерения электропроводности полупроводников

Ways of modifying known methods and devices for measuring the conductivity of semiconductor materials are considered. A block diagram of the device is presented, in which a differential measurement method and single‑channel processing of the measuring signal are implemented. The functioning of indiv...

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Bibliographic Details
Date:2007
Main Authors: Ascheulov, A. A., Buchkovskii, I. A., Romanyuk, I. S.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2007
Subjects:
электропроводность полупроводников
индуктивный датчик
добротность контура
поглощение энергии электромагнитного поля
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2007.2.55
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment
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Summary:Ways of modifying known methods and devices for measuring the conductivity of semiconductor materials are considered. A block diagram of the device is presented, in which a differential measurement method and single‑channel processing of the measuring signal are implemented. The functioning of individual blocks and of the device as a whole is described.

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